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Toshiyuki Okayasu

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

9

Venues

1

Active years

1994–2013

Best venue rank

A

Where they publish

Papers

9 indexed papers, newest first.

YearVenueTitleAuthors
2013ITC30-Gb/s optical and electrical test solution for high-volume testing.Daisuke Watanabe, Shin Masuda, Hideo Hara, Tsuyoshi Ataka, Atsushi Seki, Atsushi Ono, Toshiyuki Okayasu
2012ITCReal-time testing method for 16 Gbps 4-PAM signal interface.Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu
2011ITCReal-time testing method for 16 Gbps 4-PAM signal interface.Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu
2009ITCDynamic arbitrary jitter injection method for ≫6.5Gb/s SerDes testing.Tasuku Fujibe, Masakatsu Suda, Kazuhiro Yamamoto, Yoshihito Nagata, Kazuhiro Fujita, Daisuke Watanabe, Toshiyuki Okayasu
2006ITCMulti Strobe Circuit for 2.133GHz Memory Test System.Kazuhiro Yamamoto, Masakatsu Suda, Toshiyuki Okayasu, Hirokatsu Niijima, Koichi Tanaka
2005ITCCMOS high-speed, high-precision timing generator for 4.266-Gbps memory test system.Masakatsu Suda, Kazuhiro Yamamoto, Toshiyuki Okayasu, Shusuke Kantake, Satoshi Sudou, Daisuke Watanabe
2004ITC34.1Gbps Low Jitter, Low BER High-Speed Parallel CMOS Interface for Interconnections in High-Speed Memory Test System.Daisuke Watanabe, Masakatsu Suda, Toshiyuki Okayasu
2002ITCCMOS Circuit Technology for Precise GHz Timing Generator.Toshiyuki Okayasu, Masakatsu Suda, Kazuhiro Yamamoto
1994ITCUltra Hi-Speed Pin-Electronics and Test Station Using GaAs IC.Takashi Sekino, Toshiyuki Okayasu