Vinay Dabholkar
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
1995–1998
Best venue rank
National
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1998 | VLSID | Computing Stress Tests for Gate Oxide Shorts. | Vinay Dabholkar, Sreejit Chakravarty |
| 1995 | VTS | Cyclic stress tests for full scan circuits. | Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel |