| 2016 | ITC | What we know after twelve years developing and deploying test data analytics solutions. | Kenneth M. Butler, Amit Nahar, W. Robert Daasch |
| 2016 | VTS | Consistency in wafer based outlier screening. | Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli |
| 2015 | ITC | Generalization of an outlier model into a "global" perspective. | Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch |
| 2014 | ITC | Board manufacturing test correlation to IC manufacturing test. | C. Glenn Shirley, W. Robert Daasch, Phil Nigh, Zoe Conroy |
| 2011 | ITC | Die-level adaptive test: Real-time test reordering and elimination. | Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar |
| 2009 | ITC | Application of non-parametric statistics of the parametric response for defect diagnosis. | Rama Gudavalli, W. Robert Daasch, Phil Nigh, Douglas Heaberlin |
| 2007 | ITC | Silicon evaluation of longest path avoidance testing for small delay defects. | Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke |
| 2005 | ITC | Variance reduction and outliers: statistical analysis of semiconductor test data. | W. Robert Daasch, Robert Madge |
| 2005 | ITC | Data-driven models for statistical testing: measurements, estimates and residuals. | W. Robert Daasch, Robert Madge |
| 2005 | ITC | The value of statistical testing for quality, yield and test cost improvement. | Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch |
| 2005 | ITC | Burn-in reduction using principal component analysis. | Amit Nahar, W. Robert Daasch, Suresh Subramaniam |
| 2005 | VTS | Defect Screening Using Independent Component Analysis on I_DDQ. | Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch |
| 2004 | ISCAS | A radio-frequency CMOS active inductor and its application in designing high-Q filters. | Haiqiao Xiao, Rolf Schaumann, W. Robert Daasch, Phillip K. Wong, Branimir Pejcinovic |
| 2004 | ITC | Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester. | W. Robert Daasch, Manu Rehani |
| 2004 | ITC | In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. | Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler |
| 2004 | ITC | Minimum Testing Requirements to Screen Temperature Dependent Defects. | Chris Schuermyer, Jens Ruffler, W. Robert Daasch |
| 2004 | VTS | Detection of Temperature Sensitive Defects Using ZTC. | Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware |
| 2003 | ITC | Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. | Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning |
| 2003 | VTS | Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. | Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch |
| 2002 | ITC | Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data. | W. Robert Daasch, Kevin Cota, James McNames, Robert Madge |
| 2002 | ITC | Screening MinVDD Outliers Using Feed-Forward Voltage Testing. | Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner |
| 2002 | ITC | Isolating and Removing Sources of Variation in Test Data. | David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge |
| 2002 | VTS | Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. | Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch |
| 2001 | ITC | Neighbor selection for variance reduction in I_DDQ and other parametric data. | W. Robert Daasch, Kevin Cota, James McNames, Robert Madge |
| 2000 | ITC | Variance reduction using wafer patterns in I_ddQ data. | W. Robert Daasch, James McNames, Daniel Bockelman, Kevin Cota |
| 1993 | ISCAS | A 20 MHz Fully-balanced Transconductance-C Filter in 2 µm CMOS Technology. | Pan Wu, Rolf Schaumann, W. Robert Daasch |
| 1987 | ICS | High Speed Interconnection Using the Clos Network. | William A. Payne III, Fillia Makedon, W. Robert Daasch |