| 2006 | ITC | Comparison of Delay Tests on Silicon. | Wangqi Qiu, D. M. H. Walker, Neil Simpson, Divya Reddy, Anthony Moore |
| 2005 | ITC | A vector-based approach for power supply noise analysis in test compaction. | Jing Wang, Ziding Yue, Xiang Lu, Wangqi Qiu, Weiping Shi, D. M. H. Walker |
| 2005 | VTS | Static Compaction of Delay Tests Considering Power Supply Noise. | Jing Wang, Xiang Lu, Wangqi Qiu, Ziding Yue, Steve Fancler, Weiping Shi, D. M. H. Walker |
| 2004 | ASPDAC | Longest path selection for delay test under process variation. | Xiang Lu, Zhuo Li, Wangqi Qiu, D. M. H. Walker, Weiping Shi |
| 2004 | ITC | K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits. | Wangqi Qiu, Jing Wang, D. M. H. Walker, Divya Reddy, Zhuo Li, Weiping Shi, Hari Balachandran |
| 2004 | SODA | Minimum moment Steiner trees. | Wangqi Qiu, Weiping Shi |
| 2004 | VTS | A Statistical Fault Coverage Metric for Realistic Path Delay Faults. | Wangqi Qiu, Xiang Lu, Jing Wang, Zhuo Li, D. M. H. Walker, Weiping Shi |
| 2003 | ITC | An Efficient Algorithm for Finding the K Longest Testable Paths Through Each Gate in a Combinational Circuit. | Wangqi Qiu, D. M. H. Walker |
| 2003 | VTS | A Circuit Level Fault Model for Resistive Opens and Bridges. | Zhuo Li, Xiang Lu, Wangqi Qiu, Weiping Shi, D. M. H. Walker |