Wilfried Redemund
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
5
Venues
2
Active years
2010–2018
Best venue rank
A
Where they publish
Papers
5 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2018 | ITC | DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. | Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski |
| 2014 | ETS | Cell-aware experiences in a high-quality automotive test suite. | Friedrich Hapke, Ralf Arnold, Matthias Beck, M. Baby, S. Straehle, J. F. Goncalves, A. Panait, R. Behr, Gwenol Maugard, A. Prashanthi, Juergen Schloeffel, Wilfried Redemund, Andreas Glowatz, Anja Fast, Janusz Rajski |
| 2012 | ITC | Cell-aware Production test results from a 32-nm notebook processor. | Friedrich Hapke, Michael Reese, Jason Rivers, A. Over, V. Ravikumar, Wilfried Redemund, Andreas Glowatz, Jrgen Schlffel, Janusz Rajski |
| 2011 | ITC | Cell-aware analysis for small-delay effects and production test results from different fault models. | Friedrich Hapke, Jrgen Schlffel, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, J. Rearick, Jason Rivers |
| 2010 | ITC | Defect-oriented cell-internal testing. | Friedrich Hapke, Wilfried Redemund, Jrgen Schlffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger |