| 1994 | ICCD | A New Test Generation Methodology Using Selective Clocking for the Clock Line Controlled Circuits. | Sanghyeon Baeg, William A. Rogers |
| 1994 | ITC | Hybrid Design for Testability Combining Scan and Clock Line Control and Method for Test Generation. | Sanghyeon Baeg, William A. Rogers |
| 1992 | ICCD | A Synthesis Algorithm for Two-Level XOR Based Circuits. | Mark A. Heap, William A. Rogers, M. Ray Mercer |
| 1991 | ICCAD | The Impedance Fault Model and Design for Robust Impedance Fault Testability. | Mark D. Sloan, William A. Rogers, Srihari Shoroff |
| 1991 | VTS | STarS: a target switching algorithm for sequential test generation. | Mark A. Heap, William A. Rogers, William B. Burns |
| 1989 | ICCAD | FANHAT: fanout oriented hierarchical automatic test generation system. | Hyoung B. Min, William A. Rogers, Hwei-Tsu Ann Luh |
| 1989 | ITC | Search Strategy Switching: An Alternative to Increased Backtracking. | Hyoung B. Min, William A. Rogers |
| 1988 | DAC | Fault Simulation in a Distributed Environment. | Patrick A. Duba, Rabindra K. Roy, Jacob A. Abraham, William A. Rogers |
| 1986 | ITC | Structured Functional Level Test Generation Using Binary Decision Diagrams. | Hongtao P. Chang, William A. Rogers, Jacob A. Abraham |
| 1985 | ITC | CHIEFS : A Concurrent, Hierarchical and Extensible Fault Simulator. | William A. Rogers, Jacob A. Abraham |