William Burchanowski
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
2005–2006
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2006 | ITC | An Accelerated Jitter Tolerance Test Technique on Ate for 1.5GB/S and 3GB/S Serial-ATA. | Yongquan Fan, Yi Cai, Liming Fang, Anant Verma, William Burchanowski, Zeljko Zilic, Sandeep Kumar |
| 2005 | ITC | A comprehensive production test solution for 1.5Gb/s and 3Gb/s serial-ATA - based on AWG and undersampling techniques. | Yi Cai, Amit Bhattacharyya, Joe Martone, Anant Verma, William Burchanowski |