A comprehensive production test solution for 1.5Gb/s and 3Gb/s serial-ATA - based on AWG and undersampling techniques.
Yi Cai, Amit Bhattacharyya, Joe Martone, Anant Verma, William Burchanowski
Browse the full ITC paper archive.
Yi Cai, Amit Bhattacharyya, Joe Martone, Anant Verma, William Burchanowski
Browse the full ITC paper archive.