| 2011 | DAC | To DFM or not to DFM? | Wing Chiu Tam, R. D. (Shawn) Blanton |
| 2011 | ITC | Physically-aware analysis of systematic defects in integrated circuits. | Wing Chiu Tam, R. D. (Shawn) Blanton |
| 2011 | VTS | SLIDER: A fast and accurate defect simulation framework. | Wing Chiu Tam, Ronald D. Blanton |
| 2010 | ITC | Automatic classification of bridge defects. | Jeffrey E. Nelson, Wing Chiu Tam, Ronald D. Blanton |
| 2010 | ITC | Systematic defect identification through layout snippet clustering. | Wing Chiu Tam, Osei Poku, Ronald D. Blanton |
| 2010 | VTS | Evaluating yield and testing impact of sub-wavelength lithography. | Wing Chiu Tam, R. D. (Shawn) Blanton, Wojciech Maly |
| 2009 | DAC | Automated failure population creation for validating integrated circuit diagnosis methods. | Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton |
| 2009 | VTS | Controlling DPPM through Volume Diagnosis. | Xiaochun Yu, Yen-Tzu Lin, Wing Chiu Tam, Osei Poku, Ronald D. Blanton |
| 2008 | DAC | Precise failure localization using automated layout analysis of diagnosis candidates. | Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton |