Xiangdong Xuan
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2004–2004
Best venue rank
B
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2004 | ETS | Application of local design-for-reliability techniques for reducing wear-out degradation of CMOS combinational logic circuits. | Xiangdong Xuan, Abhijit Chatterjee, Adit D. Singh |