Yun-Che Wen
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
3
Active years
2000–2009
Best venue rank
C
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2009 | DDECS | Test scheme for switched-capacitor circuits by digital analyses. | Yun-Che Wen |
| 2005 | VTS | A BIST Scheme for Testing Analog-to-Digital Converters with Digital Response Analyses. | Yun-Che Wen |
| 2000 | DATE | An on Chip ADC Test Structure. | Yun-Che Wen, Kuen-Jong Lee |