A Software Technique to Improve Yield of Processor Chips in Presence of Ultra-Leaky SRAM Cells Caused by Process Variation.
Maziar Goudarzi, Tohru Ishihara, Hiroto Yasuura
Browse the full ASPDAC paper archive.
Maziar Goudarzi, Tohru Ishihara, Hiroto Yasuura
Browse the full ASPDAC paper archive.