Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
DAC
/
Paper
Characterizing Process Variation in Nanometer CMOS.
Kanak Agarwal
,
Sani R. Nassif
Venue
A*
DAC
Year
2007
Proceedings
DAC
DBLP record
conf/dac/AgarwalN07 ↗
Browse the full
DAC paper archive
.