Sani R. Nassif
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
87
Venues
13
Active years
1986–2026
Best venue rank
A*
Where they publish
Papers
87 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | VTS | SHOUT - Silent Data Corruption Hunting and Observation Using Transformers. | Seyedeh Maryam Ghasemi, Shanmukha Mangadahalli Siddaramu, Tara Gheshlaghi, Sani R. Nassif, Mehdi B. Tahoori |
| 2025 | ETS | Analysis and Mitigation of Radiation Effects in SRAM-based Register Files. | Zhe Zhang, Surendra Hemaram, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2025 | ISCAS | GDS2SEM: Diffusion-based Layout-to-SEM Post-Fabrication Emulation for IC Validation. | Walaa Amer, Sani R. Nassif, Fadi J. Kurdahi |
| 2025 | ISCAS | Enabling Machine Learning for Power Modeling via Artificial Netlist Generation. | Philipp Fengler, Junpeng Chen, Sani R. Nassif, Ulf Schlichtmann |
| 2025 | ISCAS | Machine Learning for Improving Timing Accuracy. | Mohamed Amine Riahi, Sani R. Nassif, Norbert Wehn |
| 2024 | ASPDAC | Timing Analysis beyond Complementary CMOS Logic Styles. | Jan Lappas, Mohamed Amine Riahi, Christian Weis, Norbert Wehn, Sani R. Nassif |
| 2024 | DATE | Analog Printed Spiking Neuromorphic Circuit. | Priyanjana Pal, Haibin Zhao, Maha Shatta, Michael Hefenbrock, Sina Bakhtavari Mamaghani, Sani R. Nassif, Michael Beigl, Mehdi B. Tahoori |
| 2024 | IOLTS | Do Radiation and Aging Impact DVFS? TCAD-based Analysis on 22 nm FDSOI Latches. | Zhe Zhang, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif |
| 2024 | ITC | Testing for aging in advanced SRAM: From front end of the line transistors to back end of the line interconnects. | Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2024 | VTS | Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management. | Zhe Zhang, Mahta Mayahinia, Christian Weis, Norbert Wehn, Mehdi B. Tahoori, Sani R. Nassif, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
| 2019 | DATE | SRAM Design Exploration with Integrated Application-Aware Aging Analysis. | Alexandra Listl, Daniel Mueller-Gritschneder, Ulf Schlichtmann, Sani R. Nassif |
| 2014 | ASPDAC | Applying VLSI EDA to energy distribution system design. | Sani R. Nassif, Gi-Joon Nam, Jerry Hayes, Sani Fakhouri |
| 2014 | DAC | Radiation-Induced Soft Error Analysis of SRAMs in SOI FinFET Technology: A Device to Circuit Approach. | Saman Kiamehr, Thomas H. Osiecki, Mehdi Baradaran Tahoori, Sani R. Nassif |
| 2014 | DATE | Connecting different worlds - Technology abstraction for reliability-aware design and Test. | Ulf Schlichtmann, Veit Kleeberger, Jacob A. Abraham, Adrian Evans, Christina Gimmler-Dumont, Michael Gla, Andreas Herkersdorf, Sani R. Nassif, Norbert Wehn |
| 2014 | ICCAD | Smart grid load balancing techniques via simultaneous switch/tie-line/wire configurations. | Iris Hui-Ru Jiang, Gi-Joon Nam, Hua-Yu Chang, Sani R. Nassif, Jerry Hayes |
| 2013 | DAC | Reliable on-chip systems in the nano-era: lessons learnt and future trends. | Jrg Henkel, Lars Bauer, Nikil D. Dutt, Puneet Gupta, Sani R. Nassif, Muhammad Shafique, Mehdi Baradaran Tahoori, Norbert Wehn |
| 2013 | DATE | Incorporating the impacts of workload-dependent runtime variations into timing analysis. | Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori, Sani R. Nassif |
| 2013 | ETS | Extracting device-parameter variations using a single sensitivity-configurable ring oscillator. | Yuma Higuchi, Kenichi Shinkai, Masanori Hashimoto, Rahul M. Rao, Sani R. Nassif |
| 2013 | ICCAD | ICCAD-2013 CAD contest in mask optimization and benchmark suite. | Shayak Banerjee, Zhuo Li, Sani R. Nassif |
| 2013 | ICCS | Hardware Acceleration of an Efficient and Accurate Proton Therapy Monte Carlo. | Thomas H. Osiecki, Min-Yu Tsai, Anne E. Gattiker, Damir A. Jamsek, Sani R. Nassif, William Evan Speight, Cliff C. N. Sze |
| 2013 | ISCAS | SRAM device and cell co-design considerations in a 14nm SOI FinFET technology. | Binjie Cheng, Xingsheng Wang, Andrew R. Brown, Jente B. Kuang, Dave Reid, Campbell Millar, Sani R. Nassif, Asen Asenov |
| 2012 | ASPDAC | Robust and resilient designs from the bottom-up: Technology, CAD, circuit, and system issues. | Vijay Janapa Reddi, David Z. Pan, Sani R. Nassif, Keith A. Bowman |
| 2012 | DAC | Yield estimation via multi-cones. | Rouwaida Kanj, Rajiv V. Joshi, Zhuo Li, Jerry Hayes, Sani R. Nassif |
| 2012 | ICCAD | 2012 TAU power grid simulation contest: Benchmark suite and results. | Zhuo Li, Raju Balasubramanian, Frank Liu, Sani R. Nassif |
| 2012 | VTS | An oscillation-based test structure for timing information extraction. | Eun Jung Jang, Anne Gattiker, Sani R. Nassif, Jacob A. Abraham |
| 2011 | ICCAD | A framework for double patterning-enabled design. | Rani S. Ghaida, Kanak B. Agarwal, Sani R. Nassif, Xin Yuan, Lars Liebmann, Puneet Gupta |
| 2011 | ICCAD | Accelerated statistical simulation via on-demand Hermite spline interpolations. | Rouwaida Kanj, Tong Li, Rajiv V. Joshi, Kanak Agarwal, Ali Sadigh, David Winston, Sani R. Nassif |
| 2011 | ICCAD | 2011 TAU power grid simulation contest: Benchmark suite and results. | Zhuo Li, Raju Balasubramanian, Frank Liu, Sani R. Nassif |
| 2011 | ISCAS | Ultra-low power current-based PUF. | Mehrdad Majzoobi, Golsa Ghiaasi, Farinaz Koushanfar, Sani R. Nassif |
| 2011 | VTS | Efficient and product-representative timing model validation. | Eun Jung Jang, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham |
| 2010 | DATE | A methodology for propagating design tolerances to shape tolerances for use in manufacturing. | Shayak Banerjee, Kanak B. Agarwal, Chin Ngai Sze, Sani R. Nassif, Michael Orshansky |
| 2010 | DATE | A resilience roadmap. | Sani R. Nassif, Nikil Mehta, Yu Cao |
| 2010 | ICCAD | Template-mask design methodology for double patterning technology. | Chin-Hsiung Hsu, Yao-Wen Chang, Sani R. Nassif |
| 2010 | ISLPED | Statistical leakage modeling for accurate yield analysis: the CDF matching method and its alternatives. | Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif |
| 2009 | DATE | Analyzing the impact of process variations on parametric measurements: Novel models and applications. | Sherief Reda, Sani R. Nassif |
| 2009 | ICCAD | Yield estimation of SRAM circuits using "Virtual SRAM Fab". | Aditya Bansal, Rama N. Singh, Rouwaida Kanj, Saibal Mukhopadhyay, Jin-Fuw Lee, Emrah Acar, Amith Singhee, Keunwoo Kim, Ching-Te Chuang, Sani R. Nassif, Fook-Luen Heng, Koushik K. Das |
| 2009 | ICCAD | Simultaneous layout migration and decomposition for double patterning technology. | Chin-Hsiung Hsu, Yao-Wen Chang, Sani R. Nassif |
| 2009 | ICCAD | An elegant hardware-corroborated statistical repair and test methodology for conquering aging effects. | Rouwaida Kanj, Rajiv V. Joshi, Chad Adams, James D. Warnock, Sani R. Nassif |
| 2008 | ASPDAC | Technology modeling and characterization beyond the 45nm node. | Sani R. Nassif |
| 2008 | ASPDAC | Power grid analysis benchmarks. | Sani R. Nassif |
| 2008 | ASPDAC | Analytical model for the impact of multiple input switching noise on timing. | Rajeshwary Tayade, Sani R. Nassif, Jacob A. Abraham |
| 2008 | DAC | Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness. | Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao |
| 2008 | DATE | Design Variability: Challenges and Solutions at Microarchitecture-Architecture Level. | Diana Marculescu, Sani R. Nassif |
| 2008 | ICCAD | MAPS: multi-algorithm parallel circuit simulation. | Xiaoji Ye, Wei Dong, Peng Li, Sani R. Nassif |
| 2008 | ISLPED | SRAM methodology for yield and power efficiency: per-element selectable supplies and memory reconfiguration schemes. | Rouwaida Kanj, Rajiv V. Joshi, Zhuo Li, Jente B. Kuang, Hung C. Ngo, Nancy Ying Zhou, Weiping Shi, Sani R. Nassif |
| 2008 | VLSID | Cross-Layer Approaches to Designing Reliable Systems Using Unreliable Chips. | Fadi J. Kurdahi, Nikil D. Dutt, Ahmed M. Eltawil, Sani R. Nassif |
| 2007 | DAC | Characterizing Process Variation in Nanometer CMOS. | Kanak Agarwal, Sani R. Nassif |
| 2007 | DAC | Accurate Waveform Modeling using Singular Value Decomposition with Applications to Timing Analysis. | Anand Ramalingam, Ashish Kumar Singh, Sani R. Nassif, Michael Orshansky, David Z. Pan |
| 2007 | DAC | Modeling and Analysis of Non-Rectangular Gate for Post-Lithography Circuit Simulation. | Ritu Singhal, Asha Balijepalli, Anupama R. Subramaniam, Frank Liu, Sani R. Nassif, Yu Cao |
| 2006 | DAC | Statistical analysis of SRAM cell stability. | Kanak Agarwal, Sani R. Nassif |
| 2006 | DAC | Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events. | Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif |
| 2006 | DAC | Variation-aware analysis: savior of the nanometer era? | Sani R. Nassif, Vijay Pitchumani, Norma Rodriguez, Dennis Sylvester, Clive Bittlestone, Riko Radojcic |
| 2006 | ICCAD | An accurate sparse matrix based framework for statistical static timing analysis. | Anand Ramalingam, Gi-Joon Nam, Ashish Kumar Singh, Michael Orshansky, Sani R. Nassif, David Z. Pan |
| 2006 | ICCAD | Analytical modeling of SRAM dynamic stability. | Bin Zhang, Ari Arapostathis, Sani R. Nassif, Michael Orshansky |
| 2006 | ISCAS | Characterization of total chip leakage using inverse (reciprocal) gamma distribution. | Emrah Acar, Kanak Agarwal, Sani R. Nassif |
| 2006 | ISCAS | Methods for estimating decoupling capacitance of nonswitching circuit blocks. | Sani R. Nassif, Kanak Agarwal, Emrah Acar |
| 2006 | ISLPED | Model to hardware matching: for nano-meter scale technologies. | Sani R. Nassif |
| 2005 | DAC | The Titanic: what went wrong! | Sani R. Nassif, Paul S. Zuchowski, Claude Moughanni, Mohamed Moosa, Stephen D. Posluszny, Ward Vercruysse |
| 2005 | DATE | Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction. | Peng Li, Frank Liu, Xin Li, Lawrence T. Pileggi, Sani R. Nassif |
| 2005 | ICCD | Benefits and Costs of Power-Gating Technique. | Hailin Jiang, Malgorzata Marek-Sadowska, Sani R. Nassif |
| 2005 | ISCAS | Power-aware global signaling strategies. | Rahul M. Rao, Kanak Agarwal, Dennis Sylvester, Himanshu Kaul, Richard B. Brown, Sani R. Nassif |
| 2005 | ITC | Testing and debugging delay faults in dynamic circuits. | Ramyanshu Datta, Sani R. Nassif, Robert K. Montoye, Jacob A. Abraham |
| 2005 | VLSID | Power Variability and Its Impact on Design. | Anirudh Devgan, Sani R. Nassif |
| 2004 | DAC | Variational delay metrics for interconnect timing analysis. | Kanak Agarwal, Dennis Sylvester, David T. Blaauw, Frank Liu, Sani R. Nassif, Sarma B. K. Vrudhula |
| 2004 | ICCAD | The care and feeding of your statistical static timer. | Sani R. Nassif, Duane S. Boning, Nagib Hakim |
| 2004 | ICCAD | A chip-level electrostatic discharge simulation strategy. | Haifeng Qian, Joseph N. Kozhaya, Sani R. Nassif, Sachin S. Sapatnekar |
| 2004 | ISLPED | The impact of variability on power. | Sani R. Nassif |
| 2004 | ISLPED | Approaches to run-time and standby mode leakage reduction in global buses. | Rahul M. Rao, Kanak Agarwal, Dennis Sylvester, Richard B. Brown, Kevin J. Nowka, Sani R. Nassif |
| 2003 | ASPDAC | Predicting short circuit power from timing models. | Emrah Acar, Ravishankar Arunachalam, Sani R. Nassif |
| 2003 | DAC | Random walks in a supply network. | Haifeng Qian, Sani R. Nassif, Sachin S. Sapatnekar |
| 2003 | DAC | Power grid reduction based on algebraic multigrid principles. | Haihua Su, Emrah Acar, Sani R. Nassif |
| 2003 | ISLPED | Leakage and leakage sensitivity computation for combinational circuits. | Emrah Acar, Anirudh Devgan, Rahul M. Rao, Ying Liu, Haihua Su, Sani R. Nassif, Jeffrey L. Burns |
| 2003 | ISLPED | Full chip leakage estimation considering power supply and temperature variations. | Haihua Su, Frank Liu, Anirudh Devgan, Emrah Acar, Sani R. Nassif |
| 2002 | DAC | Congestion-driven codesign of power and signal networks. | Haihua Su, Jiang Hu, Sachin S. Sapatnekar, Sani R. Nassif |
| 2002 | DATE | A Linear-Centric Simulation Framework for Parametric Fluctuations. | Emrah Acar, Sani R. Nassif, Lawrence T. Pileggi |
| 2002 | ISCAS | Static timing analysis based circuit-limited-yield estimation. | Anne E. Gattiker, Sani R. Nassif, Rashmi Dinakar, Chris Long |
| 2001 | ASPDAC | Modeling and forecasting of manufacturing variations (embedded tutorial). | Sani R. Nassif |
| 2001 | ASPDAC | Beyond the red brick wall (panel): challenges and solutions in 50nm physical design. | Hidetoshi Onodera, Andrew B. Kahng, Wayne Wei-Ming Dai, Sani R. Nassif, Juho Kim, Akira Tanabe, Toshihiro Hattori |
| 2001 | ICCAD | Multigrid-Like Technique for Power Grid Analysis. | Joseph N. Kozhaya, Sani R. Nassif, Farid N. Najm |
| 2000 | DAC | Impact of interconnect variations on the clock skew of a gigahertz microprocessor. | Ying Liu, Sani R. Nassif, Lawrence T. Pileggi, Andrzej J. Strojwas |
| 2000 | DAC | A methodology for modeling the effects of systematic within-die interconnect and device variation on circuit performance. | Vikas Mehrotra, Shiou Lin Sam, Duane S. Boning, Anantha P. Chandrakasan, Rakesh Vallishayee, Sani R. Nassif |
| 2000 | DAC | When bad things happen to good chips (panel session). | N. S. Nagaraj, Andrzej J. Strojwas, Sani R. Nassif, Ray Hokinson, Tak Young, Wonjae L. Kang, David Overhauser, Sung-Mo Kang |
| 2000 | DAC | Fast power grid simulation. | Sani R. Nassif, Joseph N. Kozhaya |
| 2000 | DATE | Designing Closer to the Edge. | Sani R. Nassif |
| 2000 | ISCAS | Multi-grid methods for power grid simulation. | Sani R. Nassif, Joseph N. Kozhaya |
| 1999 | ICCAD | SOI technology and tools (abstract). | Sani R. Nassif, Tuyen V. Nguyen |
| 1986 | DAC | CINNAMON: coupled integration and nodal analysis of MOS networks. | Lus M. Vidigal, Sani R. Nassif, Stephen W. Director |