| 2016 | SIGCOMM | AC/DC TCP: Virtual Congestion Control Enforcement for Datacenter Networks. | Keqiang He, Eric Rozner, Kanak Agarwal, Yu (Jason) Gu, Wes Felter, John B. Carter, Aditya Akella |
| 2015 | SIGCOMM | Presto: Edge-based Load Balancing for Fast Datacenter Networks. | Keqiang He, Eric Rozner, Kanak Agarwal, Wes Felter, John B. Carter, Aditya Akella |
| 2014 | ICWS | Wire-Speed Differential SOAP Encoding. | Kanak Agarwal |
| 2014 | SIGCOMM | Shadow MACs: scalable label-switching for commodity ethernet. | Kanak Agarwal, Colin Dixon, Eric Rozner, John B. Carter |
| 2014 | SIGCOMM | SDN traceroute: tracing SDN forwarding without changing network behavior. | Kanak Agarwal, Eric Rozner, Colin Dixon, John B. Carter |
| 2014 | SIGCOMM | Planck: millisecond-scale monitoring and control for commodity networks. | Jeff Rasley, Brent E. Stephens, Colin Dixon, Eric Rozner, Wes Felter, Kanak Agarwal, John B. Carter, Rodrigo Fonseca |
| 2012 | ASPDAC | Design-patterning co-optimization of SRAM robustness for double patterning lithography. | Vivek Joshi, Kanak Agarwal, Dennis Sylvester |
| 2011 | DAC | Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect. | Jim Aarestad, Charles Lamech, Jim Plusquellic, Dhruva Acharyya, Kanak Agarwal |
| 2011 | ICCAD | Accelerated statistical simulation via on-demand Hermite spline interpolations. | Rouwaida Kanj, Tong Li, Rajiv V. Joshi, Kanak Agarwal, Ali Sadigh, David Winston, Sani R. Nassif |
| 2011 | ICCAD | REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations. | Charles Lamech, Jim Aarestad, Jim Plusquellic, Reza M. Rad, Kanak Agarwal |
| 2010 | ASPDAC | Analyzing electrical effects of RTA-driven local anneal temperature variation. | Vivek Joshi, Kanak Agarwal, Dennis Sylvester, David T. Blaauw |
| 2010 | DAC | Frequency domain decomposition of layouts for double dipole lithography. | Kanak Agarwal |
| 2010 | DAC | Closed-form modeling of layout-dependent mechanical stress. | Vivek Joshi, Valeriy Sukharev, Andres Torres, Kanak Agarwal, Dennis Sylvester, David T. Blaauw |
| 2010 | ICCAD | Analysis and optimization of SRAM robustness for double patterning lithography. | Vivek Joshi, Kanak Agarwal, David T. Blaauw, Dennis Sylvester |
| 2010 | ICCAD | Active learning framework for post-silicon variation extraction and test cost reduction. | Cheng Zhuo, Kanak Agarwal, David T. Blaauw, Dennis Sylvester |
| 2010 | ITC | Leveraging existing power control circuits and power delivery architecture for variability measurement. | Dhruva Acharyya, Kanak Agarwal, Jim Plusquellic |
| 2009 | ICCAD | Characterizing within-die variation from multiple supply port IDDQ measurements. | Kanak Agarwal, Dhruva Acharyya, Jim Plusquellic |
| 2008 | DAC | Leakage power reduction using stress-enhanced layouts. | Vivek Joshi, Brian Cline, Dennis Sylvester, David T. Blaauw, Kanak Agarwal |
| 2007 | DAC | Characterizing Process Variation in Nanometer CMOS. | Kanak Agarwal, Sani R. Nassif |
| 2007 | ICCAD | Efficient computation of current flow in signal wires for reliability analysis. | Kanak Agarwal, Frank Liu |
| 2006 | DAC | Statistical analysis of SRAM cell stability. | Kanak Agarwal, Sani R. Nassif |
| 2006 | ISCAS | Characterization of total chip leakage using inverse (reciprocal) gamma distribution. | Emrah Acar, Kanak Agarwal, Sani R. Nassif |
| 2006 | ISCAS | Methods for estimating decoupling capacitance of nonswitching circuit blocks. | Sani R. Nassif, Kanak Agarwal, Emrah Acar |
| 2005 | ASPDAC | Statistical modeling of cross-coupling effects in VLSI interconnects. | Mridul Agarwal, Kanak Agarwal, Dennis Sylvester, David T. Blaauw |
| 2005 | ASPDAC | Achieving continuous V | Kanak Agarwal, Dennis Sylvester, David T. Blaauw, Anirudh Devgan |
| 2005 | DAC | Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance. | Ashish Srivastava, Saumil Shah, Kanak Agarwal, Dennis Sylvester, David T. Blaauw, Stephen W. Director |
| 2005 | ISCAS | Power-aware global signaling strategies. | Rahul M. Rao, Kanak Agarwal, Dennis Sylvester, Himanshu Kaul, Richard B. Brown, Sani R. Nassif |
| 2004 | ASPDAC | A simplified transmission-line based crosstalk noise model for on-chip RLC wiring. | Kanak Agarwal, Dennis Sylvester, David T. Blaauw |
| 2004 | DAC | Variational delay metrics for interconnect timing analysis. | Kanak Agarwal, Dennis Sylvester, David T. Blaauw, Frank Liu, Sani R. Nassif, Sarma B. K. Vrudhula |
| 2004 | ICCD | A New Threshold Voltage Assignment Scheme for Runtime Leakage Reduction in On-Chip Repeaters. | Saumil Shah, Kanak Agarwal, Dennis Sylvester |
| 2004 | ISLPED | Approaches to run-time and standby mode leakage reduction in global buses. | Rahul M. Rao, Kanak Agarwal, Dennis Sylvester, Richard B. Brown, Kevin J. Nowka, Sani R. Nassif |
| 2003 | DAC | An effective capacitance based driver output model for on-chip RLC interconnects. | Kanak Agarwal, Dennis Sylvester, David T. Blaauw |
| 2003 | DAC | Simple metrics for slew rate of RC circuits based on two circuit moments. | Kanak Agarwal, Dennis Sylvester, David T. Blaauw |
| 2003 | ICCD | Optimal Inductance for On-chip RLC Interconnections. | Shidhartha Das, Kanak Agarwal, David T. Blaauw, Dennis Sylvester |
| 2002 | VLSID | Efficient Generation of Delay Change Curves for Noise-Aware Static Timing Analysis. | Kanak Agarwal, Yu Cao, Takashi Sato, Dennis Sylvester, Chenming Hu |