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Phase-adjustable error detection flip-flops with 2-stage hold driven optimization and slack based grouping scheme for dynamic voltage scaling.

Masanori Kurimoto, Hiroaki Suzuki, Rei Akiyama, Tadao Yamanaka, Haruyuki Ohkuma, Hidehiro Takata, Hirofumi Shinohara

VenueA*DAC
Year2008
ProceedingsDAC

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