EPICS: Efficient Parallel Pattern Fault Simulation for Sequential Circuits via Strongly Connected Components.

Mingjun Wang, Hui Wang, Jianan Mu, Xinyu Zhang, Bin Sun, Yihan Wen, Zizhen Liu, Feng Gu, Jun Gao, Shengwen Liang, Jing Ye, Xiaowei Li, Huawei Li

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