New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors.

Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Rafael Castro-Lpez, Elisenda Roca Moreno, Javier Martn-Martnez, Rosana Rodrguez, Montserrat Nafra, Francisco V. Fernndez

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