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Model-based fault injection for failure effect analysis - Evaluation of dependable SRAM for vehicle control units.

Yohei Nakata, Yasuhiro Ito, Yasuo Sugure, Shigeru Oho, Yusuke Takeuchi, Shunsuke Okumura, Hiroshi Kawaguchi, Masahiko Yoshimoto

VenueADSN
Year2011
ProceedingsDSN Workshops

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