Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs.

Fernanda Lima Kastensmidt, Jorge L. Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost

Browse the full ETS paper archive.