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Testing of MEMS-based microsystems.

Hans G. Kerkhoff

VenueBETS

Year2005

ProceedingsETS

DBLP recordconf/ets/Kerkhoff05 ↗

Browse the full ETS paper archive.

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Artificial Intelligence
Machine Learning
Computer Vision
Natural Language Processing
Security and Privacy
Systems and Networking
Databases and Data Management
Data Science and Information Retrieval

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