| 2021 | DDECS | Embedded Test Instrument for Intermittent Resistive Fault Detection at Chip Level and Its Reuse at Board Level. | Hassan Ebrahimi, Hans G. Kerkhoff |
| 2020 | ETS | A New Monitor Insertion Algorithm for Intermittent Fault Detection. | Hassan Ebrahimi, Hans G. Kerkhoff |
| 2020 | IOLTS | Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning. | Leila Bagheriye, Ghazanfar Ali, Hans G. Kerkhoff |
| 2020 | ISCAS | On-Chip Embedded Instruments Data Fusion and Life-Time Prognostics of Dependable VLSI-SoCs using Machine-Learning. | Ghazanfar Ali, Leila Bagheriye, Hans G. Kerkhoff |
| 2019 | ETS | IJTAG Compatible Timing Monitor with Robust Self-Calibration for Environmental and Aging Variation. | Ghazanfar Ali, Jerrin Pathrose, Hans G. Kerkhoff |
| 2019 | ITC | DARS: An EDA Framework for Reliability and Functional Safety Management of System-on-Chips. | Ahmed M. Y. Ibrahim, Hans G. Kerkhoff |
| 2019 | VTS | Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks. | Ahmed M. Y. Ibrahim, Hans G. Kerkhoff, Abrar Ibrahim, Mona Safar, M. Watheq El-Kharashi |
| 2018 | DDECS | Intermittent Resistance Fault Detection at Board Level. | Hassan Ebrahimi, Hans G. Kerkhoff |
| 2017 | DATE | BASTION: Board and SoC test instrumentation for ageing and no failure found. | Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans G. Kerkhoff, Rene Krenz-Baath, Piet Engelke |
| 2017 | ETS | Improving the dependability of AMR sensors used in automotive applications. | Andreina Zambrano, Hans G. Kerkhoff |
| 2017 | IOLTS | A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. | Ahmed Ibrahim, Hans G. Kerkhoff |
| 2017 | VTS | Structured scan patterns retargeting for dynamic instruments access. | Ahmed Ibrahim, Hans G. Kerkhoff |
| 2016 | DSD | Testing for Intermittent Resistive Faults in CMOS Integrated Systems. | Hassan Ebrahimi, Hans G. Kerkhoff |
| 2016 | ETS | Analysis and design of an on-chip retargeting engine for IEEE 1687 networks. | Ahmed Ibrahim, Hans G. Kerkhoff |
| 2016 | FDL | Designing reliable cyber-physical systems overview associated to the special session at FDL'16. | Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon D. ter Braak, Sergei Devadze, Grschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert Knighofer, Jan Malburg, Shiri Moran, Jaan Raik, Gerard K. Rauwerda, Heinz Riener, Franz Rck, Konstantin Shibin, Kim Sunesen, Jinbo Wan, Yong Zhao |
| 2016 | IOLTS | Online monitoring of the maximum angle error in AMR sensors. | Andreina Zambrano, Hans G. Kerkhoff |
| 2016 | VTS | Thermal issues in test: An overview of the significant aspects and industrial practice. | Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser |
| 2015 | DDECS | Intermittent Resistive Faults in Digital CMOS Circuits. | Hans G. Kerkhoff, Hassan Ebrahimi |
| 2015 | DSD | Unit-Based Functional IDDT Testing for Aging Degradation Monitoring in a VLIW Processor. | Yong Zhao, Hans G. Kerkhoff |
| 2015 | ETS | New drain current model for nano-meter MOS transistors on-chip threshold voltage test. | Jinbo Wan, Hans G. Kerkhoff |
| 2015 | IOLTS | On the maximization of the sustained switching activity in a processor. | Riccardo Cantoro, Matteo Sonza Reorda, Alireza Rohani, Hans G. Kerkhoff |
| 2015 | IOLTS | Fault-tolerant system for catastrophic faults in AMR sensors. | Andreina Zambrano, Hans G. Kerkhoff |
| 2014 | DATE | An embedded offset and gain instrument for OpAmp IPs. | Jinbo Wan, Hans G. Kerkhoff |
| 2014 | DDECS | Studying DAC capacitor-array degradation in charge-redistribution SAR ADCs. | Muhammad Aamir Khan, Hans G. Kerkhoff |
| 2014 | DSD | Design of an Embedded Health Monitoring Infrastructure for Accessing Multi-processor SoC Degradation. | Yong Zhao, Hans G. Kerkhoff |
| 2014 | ETS | Two soft-error mitigation techniques for functional units of DSP processors. | Alireza Rohani, Hans G. Kerkhoff |
| 2013 | DDECS | An indirect technique for estimating reliability of analog and mixed-signal systems during operational life. | Muhammad Aamir Khan, Hans G. Kerkhoff |
| 2013 | DSD | The Essence of Reliability Estimation during Operational Life for Achieving High System Dependability. | Muhammad Aamir Khan, Hans G. Kerkhoff |
| 2012 | DATE | Monitoring active filters under automotive aging scenarios with embedded instrument. | Jinbo Wan, Hans G. Kerkhoff |
| 2012 | DDECS | The design of dependable flexible multi-sensory System-on-Chips for security applications. | Hans G. Kerkhoff, Yong Zhao |
| 2012 | DSD | Investigating Dependability of Short-Range Wireless Embedded Systems through Hardware Platform Based Design. | Benaoumeur Senouci, Anne-Johan Annema, Mark J. Bentum, Hans G. Kerkhoff |
| 2012 | ETS | A robust metric for screening outliers from analogue product manufacturing tests responses. | Shaji Krishnan, Hans G. Kerkhoff |
| 2011 | DDECS | A system-level platform for dependability enhancement and its analysis for mixed-signal SoCs. | Muhammad Aamir Khan, Hans G. Kerkhoff |
| 2011 | DSD | A Technique for Accelerating Injection of Transient Faults in Complex SoCs. | Alireza Rohani, Hans G. Kerkhoff |
| 2011 | DSN | Study of the effects of SET induced faults on submicron technologies. | Alireza Rohani, Hans G. Kerkhoff |
| 2011 | ETS | A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses. | Shaji Krishnan, Hans G. Kerkhoff |
| 2011 | PRDC | A Dependability Solution for Homogeneous MPSoCs. | Xiao Zhang, Hans G. Kerkhoff |
| 2010 | DATE | Block-level bayesian diagnosis of analogue electronic circuits. | Shaji Krishnan, Klaas D. Doornbos, Rudi Brand, Hans G. Kerkhoff |
| 2010 | DSD | On-chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism. | Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen |
| 2010 | ETS | Multivariate model for test response analysis. | Shaji Krishnan, Hans G. Kerkhoff |
| 2010 | ETS | Predicting dynamic specifications of ADCs with a low-quality digital input signal. | Xiaoqin Sheng, Vincent Kerzerho, Hans G. Kerkhoff |
| 2010 | ETS | New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism. | Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen |
| 2009 | DSD | Design of a Highly Dependable Beamforming Chip. | Xiao Zhang, Hans G. Kerkhoff |
| 2009 | ETS | Algorithms for ADC Multi-site Test with Digital Input Stimulus. | Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud |
| 2005 | ETS | Testing of MEMS-based microsystems. | Hans G. Kerkhoff |
| 2003 | ETS | Scan test strategy for asynchronous-synchronous interfaces [SoC testing]. | Octavian Petre, Hans G. Kerkhoff |
| 2003 | ETS | Enhanced P1500 compliant wrapper suitable for delay fault testing of embedded cores. | H. J. Vermaak, Hans G. Kerkhoff |
| 2003 | ITC | Towards Structural Testing of Superconductor Electronics. | Arun A. Joseph, Hans G. Kerkhoff |
| 2003 | VTS | Testable Design and Testing of Micro-Electro-Fluidic Arrays. | Hans G. Kerkhoff, Mustafa Acar |
| 2002 | ITC | Automatic Scan Insertion and Test Generation for Asynchronous Circuits. | Frank te Beest, Ad M. G. Peeters, Marc Verra, Kees van Berkel, Hans G. Kerkhoff |
| 2002 | ITC | A New Test Generation Approach for Embedded Analogue Cores in SoC. | M. Stancic, Liquan Fang, M. H. H. Weusthof, R. M. W. Tijink, Hans G. Kerkhoff |
| 2002 | VTS | SoCs with MEMS? Can We Include MEMS in the SoCs Design and Test Flow? | Salvador Mir, H. Bederr, R. D. (Shawn) Blanton, Hans G. Kerkhoff, H. J. Klim |
| 2001 | ETS | Reducing analogue fault-simulation time by using high-level modelling in dotss for an industrial design. | Liquan Fang, Guido Gronthoud, Hans G. Kerkhoff |
| 2001 | ETS | Reducing the susceptibility of design-for-delay-testability structures to process- and application-induced variations. | Herman J. Vermaak, Hans G. Kerkhoff |
| 2001 | ETS | An implementation for test-time reduction in VLIW transport-triggered architectures. | V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff |
| 2001 | IOLTS | Increasing the Fault Coverage in Multiple Clock Domain Systems by Using On-Line Testing of Synchronizers. | Octavian Petre, Hans G. Kerkhoff |
| 2001 | ITC | Tackling test trade-offs from design, manufacturing to market using economic modeling. | Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff |
| 2000 | DATE | Design and Test Space Exploration of Transport-Triggered Architectures. | V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff |
| 2000 | ETS | Bridging the testing speed gap: design for delay testability. | Han Speek, Hans G. Kerkhoff, Manoj Sachdev, Mansour Shashaani |
| 2000 | VTS | A Low-Speed BIST Framework for High-Performance Circuit Testing. | Hans G. Kerkhoff, Mansour Shashaani, Manoj Sachdev |
| 1997 | DATE | Compact structural test generation for analog macros. | V. Kaal, Hans G. Kerkhoff |
| 1997 | DATE | Smart sensor system application: an integrated compass. | Ronald J. W. T. Tangelder, G. Diemel, Hans G. Kerkhoff |
| 1996 | DATE | Test Structures on MCM Active Substrate: Is it worthwhile? | Joan Oliver, Hans G. Kerkhoff |
| 1995 | DATE | Gate delay fault test generation for non-scan circuits. | G. Van Brakel, Uwe Glser, Hans G. Kerkhoff, Heinrich Theodor Vierhaus |
| 1991 | VTS | A design-for-testability expert system for silicon compilers. | R. P. van Riessen, Hans G. Kerkhoff, J. M. J. Janssen |
| 1988 | ITC | TASTE: A Tool for Analog System Testability Evaluation. | Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff |