Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model.

Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Stephan De Castro, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hly, Rgis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre

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