An approach to verify a large scale system-on-a-chip using symbolic model checking.
Koichiro Takayama, Taizo Satoh, Tsuneo Nakata, Fumiyasu Hirose
Browse the full ICCD paper archive.
Koichiro Takayama, Taizo Satoh, Tsuneo Nakata, Fumiyasu Hirose
Browse the full ICCD paper archive.