Skip to content

Ensemble Dependent Matrix Methodology for Probabilistic-Based Fault-tolerant Nanoscale Circuit Design.

Huifei Rao, Jie Chen, Changhong Yu, Woon Tiong Ang, I-Chyn Wey, An-Yeu Wu, Hong Zhao

VenueCISCAS
Year2007
ProceedingsISCAS

Browse the full ISCAS paper archive.