Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
ITC
/
Paper
Fixed-Biased Pseudorandom Built-In Self-Test for Random-Pattern-Resistant Circuits.
Mohammed F. AlShaibi
,
Charles R. Kime
Venue
A
ITC
Year
1994
Proceedings
ITC
DBLP record
conf/itc/AlShaibiK94 ↗
Browse the full
ITC paper archive
.