| 1996 | ITC | MFBIST: A BIST Method for Random Pattern Resistant Circuits. | Mohammed F. AlShaibi, Charles R. Kime |
| 1994 | ITC | Fixed-Biased Pseudorandom Built-In Self-Test for Random-Pattern-Resistant Circuits. | Mohammed F. AlShaibi, Charles R. Kime |
| 1994 | VTS | Multiple weighted cellular automata. | Danial J. Neebel, Charles R. Kime |
| 1994 | VTS | ICAT: incremental combinational ATPG. | Byung S. So, Charles R. Kime |
| 1993 | ITC | Partial Scan Using Reverse Direction Empirical Testability. | Kee Sup Kim, Charles R. Kime |
| 1993 | ITC | Inhomogeneous Cellular Automata for Weighted-Random-Pattern Generation. | Danial J. Neebel, Charles R. Kime |
| 1990 | ICCAD | Partial Scan by Use of Empirical Testability. | Kee Sup Kim, Charles R. Kime |
| 1990 | ITC | Multiple path sensitization for hierarchical circuit testing. | Chau-Chin Su, Charles R. Kime |
| 1990 | ITC | Computer-aided design of pseudoexhaustive BIST for semiregular circuits. | Chau-Chin Su, Charles R. Kime |
| 1989 | ICCD | Scheduling unequal length tests in high performance VLSI system implementations. | John Y. Sayah, Charles R. Kime |
| 1988 | ITC | Impact of Testability Standards on University Research and Instruction. | Charles R. Kime |
| 1988 | ITC | : Test Scheduling for High Performance VLSI System Implementations. | John Y. Sayah, Charles R. Kime |
| 1988 | ITC | Concurrent Off-Phase Built-in Self-Test of Dormant Logic. | Leon J. Sigal, Charles R. Kime |
| 1985 | ITC | Pseudo-Exhaustive Adjacency Testing: A BIST Approach for Stuck-Open Faults. | Gary L. Craig, Charles R. Kime |
| 1984 | ITC | A Built-In Test Methodology for VLSI Data Paths. | Charles R. Kime, H. H. Kwan, J. K. Lemke, Gerald B. Williams |