LA-DOS: Layout-Aware-Defect-Oriented Stress UDFM & ATPG Pattern Generation for Zero Defect Automotive Designs.
Mohammed Zine E. Brahmi, Jennifer Dworak, Martina Perkovic, Megan Appel, Saidapet Ramesh, Ravi J. N, Ramanath Dharmavarm, Arun Kumar Anjaneyareddy, Chen He
Browse the full ITC paper archive.