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LA-DOS: Layout-Aware-Defect-Oriented Stress UDFM & ATPG Pattern Generation for Zero Defect Automotive Designs.

Mohammed Zine E. Brahmi, Jennifer Dworak, Martina Perkovic, Megan Appel, Saidapet Ramesh, Ravi J. N, Ramanath Dharmavarm, Arun Kumar Anjaneyareddy, Chen He

VenueAITC
Year2025
ProceedingsITC

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