Jennifer Dworak
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
41
Venues
7
Active years
1999–2026
Best venue rank
A*
Where they publish
Papers
41 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2026 | VTS | Innovative Practices Session: Efficient Multi-Die Test Architecture & Repair Methods. | Tapan J. Chakraborty, Rajesh Pendurkar, Anshuman Chandra, Jennifer Dworak, Moiz Khan, Vinay Kumar Kotha |
| 2025 | ETS | European Test Symposium Teams: an Anniversary Snapshot. | Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilrd Enyedi, Iulia Stefan, Ovidiu Stan, Cosmina Corches, Zebo Peng, Petru Eles, Rolf Drechsler, S. Eggersgl, Grschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Po-Yao Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, Stefano Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, Patrick Girard, Marcello Traiola, Arnaud Virazel, Fernando Fernandes dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letcia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, Fabian Luis Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, Anurup Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand |
| 2025 | ITC | LA-DOS: Layout-Aware-Defect-Oriented Stress UDFM & ATPG Pattern Generation for Zero Defect Automotive Designs. | Mohammed Zine E. Brahmi, Jennifer Dworak, Martina Perkovic, Megan Appel, Saidapet Ramesh, Ravi J. N, Ramanath Dharmavarm, Arun Kumar Anjaneyareddy, Chen He |
| 2023 | ETS | Harvesting Wasted Clock Cycles for Efficient Online Testing. | Eslam Yassien, Yongjia Xu, Hui Jiang, Thach Nguyen, Jennifer Dworak, Theodore W. Manikas, Kundan Nepal |
| 2021 | ITC | Low Power Shift and Capture through ATPG-Configured Embedded Enable Capture Bits. | Yi Sun, Hui Jiang, Lakshmi Ramakrishnan, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, R. Iris Bahar |
| 2020 | ITC | Multi-Level Access Protection for Future IEEE P1687.1 IJTAG Networks. | David Brauchler, Jennifer Dworak |
| 2019 | VTS | Innovate Practices on CyberSecurity of Hardware Semiconductor Devices. | Alfred L. Crouch, Peter L. Levin, Jennifer Dworak, Lakshmi Ramakrishnan, Yuhe Xia, Chi Zhang, Daniel Engels, Gary Evans, Ping Gui, Scott McWilliams, Saurabh Gupta, Franco Stellari, Naigang Wang, Peilin Song |
| 2019 | VTS | A Novel Graph Coloring Based Solution for Low-Power Scan Shift. | Saurabh Gupta, Bonita Bhaskaran, Shantanu Sarangi, Ayub Abdollahian, Jennifer Dworak |
| 2018 | ITC | IJTAG Integrity Checking with Chained Hashing. | Senwen Kan, Jennifer Dworak |
| 2018 | VTS | Efficient parallel testing: A configurable and scalable broadcast network design using IJTAG. | Saurabh Gupta, Jae Wu, Jennifer Dworak |
| 2018 | VTS | Real-time monitoring of test fallout data to quickly identify tester and yield issues in a multi-site environment. | Qutaiba Khasawneh, Jennifer Dworak, Ping Gui, Benjamin Williams, Alan C. Elliott, Anand Muthaiah |
| 2017 | DASC | Systematic Test Generation for Secure Hardware Supported Virtualization. | Senwen Kan, Jennifer Dworak |
| 2017 | ITC | Increasing IJTAG bandwidth and managing security through parallel locking-SIBs. | Saurabh Gupta, Al Crouch, Jennifer Dworak, Daniel Engels |
| 2016 | ITC | Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture. | Fanchen Zhang, Daphne Hwong, Yi Sun, Allison Garcia, Soha Alhelaly, Geoff Shofner, LeRoy Winemberg, Jennifer Dworak |
| 2015 | ITC | A case study: Leverage IEEE 1687 based method to automate modeling, verification, and test access for embedded instruments in a server processor. | Tassanee Payakapan, Senwen Kan, Ken Pham, Kathy Yang, Jean-Francois Cote, Martin Keim, Jennifer Dworak |
| 2015 | VTS | A call to action: Securing IEEE 1687 and the need for an IEEE test Security Standard. | Jennifer Dworak, Al Crouch |
| 2014 | DATE | Making it harder to unlock an LSIB: Honeytraps and misdirection in a P1687 network. | Adam Zygmontowicz, Jennifer Dworak, Al Crouch, John C. Potter |
| 2014 | ITC | Board security enhancement using new locking SIB-based architectures. | Jennifer Dworak, Zoe Conroy, Alfred L. Crouch, John C. Potter |
| 2014 | VTS | Special session 4A: Elevator talks. | Jennifer Dworak |
| 2013 | ITC | Don't forget to lock your SIB: Hiding instruments using P16871. | Jennifer Dworak, Al Crouch, John C. Potter, Adam Zygmontowicz, Micah Thornton |
| 2013 | VTS | Special session 4B: Elevator talks. | Jennifer Dworak, Ronald Shawn Blanton, Masahiro Fujita, Kazumi Hatayama, Naghmeh Karimi, Michail Maniatakos, Antonis M. Paschalis, Adit D. Singh, Tian Xia |
| 2011 | ETS | Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis. | Nuno Alves, Yiwen Shi, Nicholas Imbriglia, Jennifer Dworak, Kundan Nepal, R. Iris Bahar |
| 2011 | ITC | Partial state monitoring for fault detection estimation. | Yiwen Shi, Kantapon Kaewtip, Wan-Chan Hu, Jennifer Dworak |
| 2011 | VTS | Enhancing online error detection through area-efficient multi-site implications. | Nuno Alves, Yiwen Shi, Jennifer Dworak, R. Iris Bahar, Kundan Nepal |
| 2010 | DATE | NIM- a noise index model to estimate delay discrepancies between silicon and simulation. | Elif Alpaslan, Jennifer Dworak, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Paul van de Wiel |
| 2010 | VTS | Too many faults, too little time on creating test sets for enhanced detection of highly critical faults and defects. | Yiwen Shi, Wan-Chan Hu, Jennifer Dworak |
| 2009 | DATE | Detecting errors using multi-cycle invariance information. | Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris Bahar |
| 2009 | ICCAD | Compacting test vector sets via strategic use of implications. | Nuno Alves, Jennifer Dworak, R. Iris Bahar, Kundan Nepal |
| 2008 | ITC | Using Implications for Online Error Detection. | Kundan Nepal, Nuno Alves, Jennifer Dworak, R. Iris Bahar |
| 2008 | VTS | Reducing Scan Shift Power at RTL. | Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak |
| 2007 | ITC | Which defects are most critical? optimizing test sets to minimize failures due to test escapes. | Jennifer Dworak |
| 2007 | VTS | An Analysis of Defect Detection for Weighted Random Patterns Generated with Observation/Excitation-Aware Partial Fault Targeting. | Jennifer Dworak |
| 2006 | DAC | A cost-effective implementation of an ECC-protected instruction queue for out-of-order microprocessors. | Vladimir Stojanovic, R. Iris Bahar, Jennifer Dworak, Richard Weiss |
| 2004 | DATE | Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects. | Jennifer Dworak, Brad Cobb, James Wingfield, M. Ray Mercer |
| 2004 | VTS | Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets. | Jennifer Dworak, David Dorsey, Amy Wang, M. Ray Mercer |
| 2002 | DAC | Enhancing test efficiency for delay fault testing using multiple-clocked schemes. | Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams |
| 2002 | DATE | A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults. | Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael R. Grimaila, M. Ray Mercer |
| 2002 | ITC | Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. | Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams |
| 2000 | ITC | Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. | Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer |
| 1999 | ITC | Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. | Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer |
| 1999 | VTS | REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. | Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer |