Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
ITC
/
Paper
A study of test quality/tester scan memory trade-offs using the SEMATECH test methods data.
Kenneth M. Butler
Venue
A
ITC
Year
1999
Proceedings
ITC
DBLP record
conf/itc/Butler99 ↗
Browse the full
ITC paper archive
.