| 2017 | ITC | Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter. | Li Xu, Yuming Zhuang, Rajavelu Thinakaran, Kenneth M. Butler, Degang Chen |
| 2016 | ITC | What we know after twelve years developing and deploying test data analytics solutions. | Kenneth M. Butler, Amit Nahar, W. Robert Daasch |
| 2016 | ITC | Statistical outlier screening as a test solution health monitor. | David Shaw, Dirk Hoops, Kenneth M. Butler, Amit Nahar |
| 2015 | DATE | A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits. | Hugo R. Gonalves, Xin Li, Miguel V. Correia, Vtor Tavares, John M. Carulli Jr., Kenneth M. Butler |
| 2014 | ITC | Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling. | Shanghang Zhang, Xin Li, Ronald D. Blanton, Jos Machado da Silva, John M. Carulli Jr., Kenneth M. Butler |
| 2013 | ETS | Adaptive quality binning for analog circuits. | Ender Yilmaz, Sule Ozev, Kenneth M. Butler |
| 2013 | ITC | A design-for-reliability approach based on grading library cells for aging effects. | Senthil Arasu, Mehrdad Nourani, John M. Carulli, Kenneth M. Butler, Vijay Reddy |
| 2013 | ITC | Test data analytics - Exploring spatial and test-item correlations in production test data. | Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler |
| 2012 | DAC | Early prediction of NBTI effects using RTL source code analysis. | Jayanand Asok Kumar, Kenneth M. Butler, Heesoo Kim, Shobha Vasudevan |
| 2011 | ITC | Test cost reduction through performance prediction using virtual probe. | Hsiu-Ming Chang, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, Kenneth M. Butler |
| 2011 | ITC | Die-level adaptive test: Real-time test reordering and elimination. | Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar |
| 2011 | ITC | Adaptive multidimensional outlier analysis for analog and mixed signal circuits. | Ender Yilmaz, Sule Ozev, Kenneth M. Butler |
| 2010 | DATE | Adapting to adaptive testing. | Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli |
| 2010 | ITC | Adaptive test flow for mixed-signal/RF circuits using learned information from device under test. | Ender Yilmaz, Sule Ozev, Kenneth M. Butler |
| 2009 | ICCD | Quality improvement and cost reduction using statistical outlier methods. | Amit Nahar, Kenneth M. Butler, John M. Carulli Jr., Charles Weinberger |
| 2008 | ITC | Modeling Test Escape Rate as a Function of Multiple Coverages. | Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena |
| 2004 | ITC | Sure You Can Get to 100 DPPM in Deep Submicron, But It'll Cost Ya. | Kenneth M. Butler |
| 2004 | ITC | Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. | Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington |
| 2003 | ITC | A Case Study of IR-Drop in Structured At-Speed Testing. | Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger |
| 2002 | ITC | Facilitating Rapid First Silicon Debug. | Hari Balachandran, Kenneth M. Butler, Neil Simpson |
| 2002 | ITC | Is ITC Bored with Board Test? | Kenneth M. Butler |
| 2002 | ITC | Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . | Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech |
| 2001 | ITC | A case study on the implementation of the Illinois Scan Architecture. | Frank F. Hsu, Kenneth M. Butler, Janak H. Patel |
| 2001 | ITC | An analysis of power reduction techniques in scan testing. | Jayashree Saxena, Kenneth M. Butler, Lee Whetsel |
| 2000 | ITC | An empirical study on the effects of test type ordering on overall test efficiency. | Jayashree Saxena, Kenneth M. Butler |
| 2000 | ITC | Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. | Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler |
| 1999 | ITC | Expediting ramp-to-volume production. | Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala |
| 1999 | ITC | Correlation of logical failures to a suspect process step. | Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith |
| 1999 | ITC | A study of test quality/tester scan memory trade-offs using the SEMATECH test methods data. | Kenneth M. Butler |
| 1999 | VTS | REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. | Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer |
| 1998 | ITC | The stuck-at fault: it ain't over 'til it's over. | Kenneth M. Butler |
| 1998 | ITC | On applying non-classical defect models to automated diagnosis. | Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess |
| 1997 | ITC | Bridging Fault Diagnosis in the Absence of Physical Information. | David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess, Jayashree Saxena, Kenneth M. Butler |
| 1997 | ITC | So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly |
| 1997 | VTS | An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken |
| 1996 | ITC | Integrating Automated Diagnosis into the Testing and Failure Analysis Operations. | Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Jones, Jayashree Saxena |
| 1995 | ITC | Deep Submicron: Is Test Up to the Challenge? | Kenneth M. Butler |
| 1995 | ITC | Test Generation and Design for Test for a Large Multiprocessing DSP. | Graham Hetherington, Greg Sutton, Kenneth M. Butler, Theo J. Powell |
| 1994 | VTS | Correlating defect level to final test fault coverage for modular structured designs [microcontroller family]. | Theo J. Powell, Kenneth M. Butler, Mike Ales, Roy Haley, Mark Perry |
| 1992 | VTS | The roles of controllability and observability in design for test. | Kenneth M. Butler, Rohit Kapur, M. Ray Mercer, Don E. Ross |
| 1991 | DAC | Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams. | Kenneth M. Butler, Don E. Ross, Rohit Kapur, M. Ray Mercer |
| 1990 | DAC | The Influences of Fault Type and Topology on Fault Model Performance and the Implications to Test and Testable Design. | Kenneth M. Butler, M. Ray Mercer |
| 1988 | DAC | CATAPULT: Concurrent Automatic Testing Allowing Parallelization and Using Limited Topology. | Rhonda Kay Gaede, Don E. Ross, M. Ray Mercer, Kenneth M. Butler |