An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing.
Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken
Browse the full VTS paper archive.
Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken
Browse the full VTS paper archive.