| 2026 | ETS | How Testing must change in the age of AI processors, Silent Data Corruption Failures and 100s of Chiplets. | Phil Nigh |
| 2026 | ETS | Gremlins in the Silicon: Why Faulty Chips are Escaping the Fab and Crashing in the Field. | Mottaqiallah Taouil, R. D. Shawn Blanton, Phil Nigh, Adit D. Singh, Said Hamdioui |
| 2016 | ETS | Testing in the year 2024 - big changes are coming. | Phil Nigh |
| 2014 | ITC | Board manufacturing test correlation to IC manufacturing test. | C. Glenn Shirley, W. Robert Daasch, Phil Nigh, Zoe Conroy |
| 2013 | ITC | Adaptive testing - Cost reduction through test pattern sampling. | Matt Grady, Bradley Pepper, Joshua Patch, Michael Degregorio, Phil Nigh |
| 2012 | ITC | How are failure modes, defect types and test methods changing for 32nm/28nm technologies and beyond? | Phil Nigh |
| 2011 | ITC | Using well/substrate bias manipulation to enhance voltage-test-based defect detection. | Anne E. Gattiker, Phil Nigh |
| 2011 | ITC | Industry leaders panel - How will testing change in the next 10 years? | Phil Nigh |
| 2009 | ITC | Application of non-parametric statistics of the parametric response for defect diagnosis. | Rama Gudavalli, W. Robert Daasch, Phil Nigh, Douglas Heaberlin |
| 2008 | ITC | Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon. | Yen-Tzu Lin, Osei Poku, Ronald D. Blanton, Phil Nigh, Peter Lloyd, Vikram Iyengar |
| 2008 | VTS | How Many Test Patterns are Useless? | Franois-Fabien Ferhani, Nirmal R. Saxena, Edward J. McCluskey, Phil Nigh |
| 2006 | VTS | Session Abstract. | Phil Nigh |
| 2004 | ITC | Achieving Quality Levels of 100dpm: It's possible - but roll up your sleeves and be prepared to do some work.. | Phil Nigh |
| 2004 | ITC | Redefining ATE: "Data Collection Engines that Drive Yield Learning and Process Optimization". | Phil Nigh |
| 2004 | ITC | Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions. | Phil Nigh, Anne E. Gattiker |
| 2003 | ITC | The Increasing Importance of On-line Testing to Ensure High-Reliability Products. | Phil Nigh |
| 2002 | ITC | Scan-Based Testing: The Only Practical Solution for Testing ASIC/Consumer Products. | Phil Nigh |
| 2002 | VTS | Debating the Future of Burn-In. | Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers |
| 2001 | VTS | MINVDD Testing for Weak CMOS ICs. | Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh |
| 2000 | ITC | Test method evaluation experiments and data. | Phil Nigh, Anne E. Gattiker |
| 1999 | ITC | Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. | Phil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato O. Forlenza, Ray Kurtulik, Wendy Chong |
| 1998 | ITC | Diagnosis and characterization of timing-related defects by time-dependent light emission. | Daniel R. Knebel, Pia N. Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika |
| 1998 | ITC | SIA Roadmap: test must not limit future technologies. | Phil Nigh |
| 1998 | ITC | Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. | Phil Nigh, David P. Vallett, Atul Patel, Jason Wright |
| 1998 | VTS | Best Methods for At-Speed Testing? | Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh |
| 1997 | ITC | Application and Analysis of IDDQ Diagnostic Software. | Phil Nigh, Donato O. Forlenza, Franco Motika |
| 1997 | ITC | So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly |
| 1997 | ITC | Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study. | Adit D. Singh, Phil Nigh, C. Mani Krishna |
| 1997 | VTS | An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken |
| 1996 | VTS | Volume Manufacturing - ICs and Boards: DFT to the Rescue? | Robert C. Aitken, J. Hutcheson, N. Murthy, Phil Nigh, Nicholas Sporck |
| 1994 | ITC | ASIC Test Cost/Strategy Trade-offs. | Donald L. Wheater, Phil Nigh, Jeanne Trinko Mechler, Luke Lacroix |
| 1989 | ICCAD | Layout-driven test generation. | Phil Nigh, Wojciech Maly |
| 1988 | ICCAD | Built-in current testing-feasibility study. | Wojciech Maly, Phil Nigh |
| 1988 | ICCAD | Testing oriented analysis of CMOS ICs with opens. | Wojciech Maly, Pranab K. Nag, Phil Nigh |
| 1988 | ICCD | Current sensing for built-in testing of CMOS circuits. | Derek B. I. Feltham, Phil Nigh, L. Richard Carley, Wojciech Maly |