Wayne M. Needham
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
7
Venues
2
Active years
1996–1998
Best venue rank
A
Where they publish
Papers
7 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1998 | ITC | Just how real is the SIA roadmap. | Wayne M. Needham |
| 1998 | ITC | High volume microprocessor test escapes, an analysis of defects our tests are missing. | Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong |
| 1998 | VTS | Best Methods for At-Speed Testing? | Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh |
| 1997 | ITC | So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly |
| 1997 | VTS | Microprocessor Test and Validation: Any New Avenues? | Magdy S. Abadir, Jacob A. Abraham, Hong Hao, C. Hunter, Wayne M. Needham, Ron G. Walther |
| 1997 | VTS | An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken |
| 1996 | ITC | DFT Strategy for Intel Microprocessors. | Wayne M. Needham, Naga Gollakota |