| 2018 | ITC | Total Critical Area Based Testing. | Friedrich Hapke, Peter C. Maxwell |
| 2017 | ETS | Bridge over troubled waters: Critical area based pattern generation. | Peter C. Maxwell, Friedrich Hapke, Maija Ryynaenen, Peter Weseloh |
| 2016 | ETS | Cell-aware diagnosis: Defective inmates exposed in their cells. | Peter C. Maxwell, Friedrich Hapke, Huaxing Tang |
| 2016 | ETS | ETS 2015 best paper. | Hans-Joachim Wunderlich, Peter C. Maxwell |
| 2012 | ETS | Adaptive testing: Conquering process variations. | Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter C. Maxwell |
| 2011 | ETS | Towards Variation-Aware Test Methods. | Ilia Polian, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, Peter C. Maxwell |
| 2010 | ETS | Adaptive test directions. | Peter C. Maxwell |
| 2007 | ETS | Wafer Level Reliability Screens. | Peter C. Maxwell |
| 2007 | ITC | Principles and results of some test cost reduction methods for ASICs. | Peter C. Maxwell |
| 2006 | ITC | The Design, Implementation and Analysis of Test Experiments. | Peter C. Maxwell |
| 2002 | ITC | The Heisenberg Uncertainty of Test. | Peter C. Maxwell |
| 2002 | ITC | Wafer/Package Test Mix for Optimal Defect Detection. | Peter C. Maxwell |
| 2002 | VTS | Debating the Future of Burn-In. | Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers |
| 2000 | ITC | Comparing functional and structural tests. | Peter C. Maxwell, Ismed Hartanto, Lee Bentz |
| 2000 | ITC | Current ratios: a self-scaling technique for production IDDQ testing. | Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman |
| 2000 | ITC | Deception by design: fooling ourselves with gate-level models. | Peter C. Maxwell, Jeff Rearick |
| 1999 | ITC | Current ratios: a self-scaling technique for production I_DDQ testing. | Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman |
| 1998 | ITC | Estimation of defect-free IDDQ in submicron circuits using switch level simulation. | Peter C. Maxwell, Jeff Rearick |
| 1998 | ITC | CMOS IC reliability indicators and burn-in economics. | Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell |
| 1998 | VTS | Best Methods for At-Speed Testing? | Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh |
| 1997 | ITC | So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly |
| 1997 | VTS | An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken |
| 1996 | ITC | I | Peter C. Maxwell, Robert C. Aitken, Kathleen R. Kollitz, Allen C. Brown |
| 1995 | ITC | The Many Faces of Test Synthesis. | Peter C. Maxwell |
| 1995 | VTS | The use of IDDQ testing in low stuck-at coverage situations. | Peter C. Maxwell |
| 1994 | ITC | The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability. | Peter C. Maxwell, Robert C. Aitken, Leendert M. Huisman |
| 1994 | VTS | Quality impacts of non-uniform fault coverage. | Peter C. Maxwell |
| 1993 | ITC | Let's Grade ALL the Faults. | Peter C. Maxwell |
| 1993 | ITC | Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic. | Peter C. Maxwell, Robert C. Aitken |
| 1992 | ITC | The Effectiveness of I | Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang |
| 1991 | ITC | The Interaction of Test and Quality. | Peter C. Maxwell |
| 1991 | ITC | The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%? | Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang |