| 2022 | EuroSys | Towards efficient processing of latency-sensitive serverless DAGs at the edge. | Xiaosu Lyu, Ludmila Cherkasova, Robert C. Aitken, Gabriel Parmer, Timothy Wood |
| 2014 | ICCD | DFM is dead - Long live DFM. | Robert C. Aitken, David Pietromonaco, Brian Cline |
| 2013 | DATE | Reliability analysis reloaded: how will we survive? | Robert C. Aitken, Grschwin Fey, Zbigniew T. Kalbarczyk, Frank Reichenbach, Matteo Sonza Reorda |
| 2013 | DATE | Leveraging sensitivity analysis for fast, accurate estimation of SRAM dynamic write V | James Boley, Vikas Chandra, Robert C. Aitken, Benton H. Calhoun |
| 2013 | DATE | SlackProbe: a low overhead in situ on-line timing slack monitoring methodology. | Liangzhen Lai, Vikas Chandra, Robert C. Aitken, Puneet Gupta |
| 2012 | ISLPED | An adaptive write word-line pulse width and voltage modulation architecture for bit-interleaved 8T SRAMs. | Daeyeon Kim, Vikas Chandra, Robert C. Aitken, David T. Blaauw, Dennis Sylvester |
| 2012 | ISLPED | Panel: going green across communications and storage systems: control of power in non-mobile devices. | Kenneth Wagner, Martin St. Laurent, Robert C. Aitken, Hugh Barrass, Randall Robinson |
| 2011 | ASPDAC | On the impact of gate oxide degradation on SRAM dynamic and static write-ability. | Vikas Chandra, Robert C. Aitken |
| 2011 | DATE | Analytical model for SRAM dynamic write-ability degradation due to gate oxide breakdown. | Vikas Chandra, Robert C. Aitken |
| 2011 | DATE | Dynamic write limited minimum operating voltage for nanoscale SRAMs. | Satyanand Nalam, Vikas Chandra, Robert C. Aitken, Benton H. Calhoun |
| 2011 | ISLPED | Variation-aware static and dynamic writability analysis for voltage-scaled bit-interleaved 8-T SRAMs. | Daeyeon Kim, Vikas Chandra, Robert C. Aitken, David T. Blaauw, Dennis Sylvester |
| 2010 | DAC | Who solves the variability problem? | Nagaraj Ns, Juan C. Rey, Jamil Kawa, Robert C. Aitken, Christian Ltkemeyer, Vijay Pitchumani, Andrzej J. Strojwas, Steve Trimberger |
| 2010 | DATE | On the efficacy of write-assist techniques in low voltage nanoscale SRAMs. | Vikas Chandra, Cezary Pietrzyk, Robert C. Aitken |
| 2010 | DATE | Analytical model for TDDB-based performance degradation in combinational logic. | Mihir R. Choudhury, Vikas Chandra, Kartik Mohanram, Robert C. Aitken |
| 2010 | DATE | TIMBER: Time borrowing and error relaying for online timing error resilience. | Mihir R. Choudhury, Vikas Chandra, Kartik Mohanram, Robert C. Aitken |
| 2010 | DATE | A black box method for stability analysis of arbitrary SRAM cell structures. | Michael Wieckowski, Dennis Sylvester, David T. Blaauw, Vikas Chandra, Sachin Idgunji, Cezary Pietrzyk, Robert C. Aitken |
| 2010 | ITC | Modeling the impact of process variation on resistive bridge defects. | S. Saqib Khursheed, Shida Zhong, Robert C. Aitken, Bashir M. Al-Hashimi, Sandip Kundu |
| 2009 | DATE | Impact of voltage scaling on nanoscale SRAM reliability. | Vikas Chandra, Robert C. Aitken |
| 2009 | VLSID | DFX and Productivity. | Robert C. Aitken |
| 2008 | DATE | Panel Session - Caution Ahead: The Road to Design and Manufacturing at 32 and 22 nm. | S. Turnoy, Peter Wintermayr, Robert C. Aitken, Rudy Lauwereins, J. Tracy Weed, V. Kiefer, J. Hartmann |
| 2007 | DATE | Worst-case design and margin for embedded SRAM. | Robert C. Aitken, Sachin Idgunji |
| 2007 | DATE | DFM/DFY: should you trust the surgeon or the family doctor? | Marco Casale-Rossi, Andrzej J. Strojwas, Robert C. Aitken, Antun Domic, Carlo Guardiani, Philippe Magarshack, Douglas Pattullo, Joseph Sawicki |
| 2006 | DATE | Low-power design tools: are EDA vendors taking this matter seriously? | Enrico Macii, Massoud Pedram, Dirk Friebel, Robert C. Aitken, Antun Domic, Roberto Zafalon |
| 2006 | IOLTS | Reliability Issues for Embedded SRAM at 90nm and Below. | Robert C. Aitken |
| 2006 | ITC | The Design and Validation of IP for DFM/DFY Assurance. | Robert C. Aitken |
| 2005 | IOLTS | Modeling Soft-Error Susceptibility for IP Blocks. | Robert C. Aitken, Betina Hold |
| 2004 | DATE | From Working Design Flow to Working Chips: Dependencies and Impacts of Methodology Decisions. | Robert C. Aitken, Fidel Muradali |
| 2004 | ITC | A Modular Wrapper Enabling High Speed BIST and Repair for Small Wide Memories. | Robert C. Aitken |
| 2003 | ITC | DFM: The Real 90nm Hurdle. | Robert C. Aitken |
| 2003 | ITC | Silicon IP And Successful DFM. | Robert C. Aitken |
| 2002 | VTS | Wireless Test. | Robert C. Aitken, Mustapha Slamani, H. Ding, William R. Eisenstadt, Sanghoon Choi, John McLaughlin |
| 2000 | ITC | Current ratios: a self-scaling technique for production IDDQ testing. | Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman |
| 1999 | ITC | It Makes Sense to Combine DFT and DFR/DFY. | Robert C. Aitken |
| 1999 | ITC | Trends in SLI design and their effect on test. | Robert C. Aitken, Fidel Muradali |
| 1999 | ITC | Current ratios: a self-scaling technique for production I_DDQ testing. | Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman |
| 1999 | VTS | Extending the Pseudo-Stuck-At Fault Model to Provide Complete IDDQ Coverage. | Robert C. Aitken |
| 1998 | ICCAD | How will CAD handle billion-transistor systems? (panel). | Robert C. Aitken, Jason Cong, Randy Harr, Kenneth L. Shepard, Wayne H. Wolf |
| 1998 | ITC | On-chip versus off-chip test: an artificial dichotomy. | Robert C. Aitken |
| 1997 | ITC | So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly |
| 1997 | VTS | Power Dissipation During Testing: Should We Worry About it? | Vishwani D. Agrawal, Robert C. Aitken, J. Braden, Joan Figueras, S. Kumar, Hans-Joachim Wunderlich, Yervant Zorian |
| 1997 | VTS | An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. | Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken |
| 1996 | ITC | Modelling the Unmodellable: Algorithmic Fault Diagnosis. | Robert C. Aitken |
| 1996 | ITC | I | Peter C. Maxwell, Robert C. Aitken, Kathleen R. Kollitz, Allen C. Brown |
| 1996 | VTS | Volume Manufacturing - ICs and Boards: DFT to the Rescue? | Robert C. Aitken, J. Hutcheson, N. Murthy, Phil Nigh, Nicholas Sporck |
| 1995 | ITC | Finding Defects with Fault Models. | Robert C. Aitken |
| 1994 | ITC | The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability. | Peter C. Maxwell, Robert C. Aitken, Leendert M. Huisman |
| 1993 | ITC | BP-1992 A Comparison of Defect Models for Fault Location with I | Robert C. Aitken |
| 1993 | ITC | Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic. | Peter C. Maxwell, Robert C. Aitken |
| 1992 | ITC | A Comparison of Defect Models for Fault Location with I | Robert C. Aitken |
| 1992 | ITC | The Effectiveness of I | Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang |
| 1991 | ITC | Fault Location with Current Monitoring. | Robert C. Aitken |
| 1991 | ITC | The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%? | Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang |
| 1989 | ICCAD | A diagnosis method using pseudo-random vectors without intermediate signatures. | Robert C. Aitken, Vinod K. Agarwal |
| 1989 | ITC | : Experiments on Aliasing in Signature Analysis Registers. | Dhiren Xavier, Robert C. Aitken, Andr Ivanov, Vinod K. Agarwal |
| 1988 | ICCAD | Aliasing probability of non-exhaustive randomized syndrome tests. | Robert C. Aitken, Vinod K. Agarwal |