A design-for-reliability approach based on grading library cells for aging effects.
Senthil Arasu, Mehrdad Nourani, John M. Carulli, Kenneth M. Butler, Vijay Reddy
Browse the full ITC paper archive.
Senthil Arasu, Mehrdad Nourani, John M. Carulli, Kenneth M. Butler, Vijay Reddy
Browse the full ITC paper archive.