| 2026 | VTS | WALET: SHAP-Guided Classification of Wafer-Level E-Test Variability for Early Manufacturing Risk Detection. | Ching-Yi Chang, Matthew Nigh, John M. Carulli, Yiorgos Makris |
| 2026 | VTS | DefectVICL: Data-Efficient Wafer Defect Classification with Vision In Context Learning. | Md Fahim Ul Islam, Soyed Tuhin Ahmed, John M. Carulli, Krishnendu Chakrabarty |
| 2025 | ICCAD | Unveiling the Mask: Trusted Semiconductor Manufacturing through Wafer-Level Mask-Set Attestation. | Suraag Sunil Tellakula, Ching-Yi Chang, Matthew Nigh, Christos Vasileiou, John M. Carulli, Yiorgos Makris |
| 2025 | VTS | Enhancing Metrology to E-test Correlation Model Accuracy through Process Expertise Integration. | Ching-Yi Chang, Matthew Nigh, John M. Carulli, Yiorgos Makris |
| 2024 | ITC | Generation and Quality Evaluation of Synthetic Process Control Monitoring Data. | Matthew Nigh, John M. Carulli, Yiorgos Makris |
| 2017 | ITC | Systematic defect detection methodology for volume diagnosis: A data mining perspective. | Chuanhe Jay Shan, Pietro Babighian, Yan Pan, John M. Carulli, Li-C. Wang |
| 2016 | ITC | Pylon: Towards an integrated customizable volume diagnosis infrastructure. | Yan Pan, Rao Desineni, Kannan Sekar, Atul Chittora, Sherwin Fernandes, Neerja Bawaskar, John M. Carulli |
| 2016 | VTS | Consistency in wafer based outlier screening. | Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli |
| 2015 | VTS | Yield prognosis for fab-to-fab product migration. | Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris |
| 2014 | VTS | Innovative practices session 5C: Machine learning and data analysis in test. | Sounil Biswas, John M. Carulli, Dragoljub Gagi Drmanac, Arpan Bhattacherjee |
| 2014 | VTS | Special session 11B: ITRS adaptive test update. | John M. Carulli |
| 2013 | ITC | A design-for-reliability approach based on grading library cells for aging effects. | Senthil Arasu, Mehrdad Nourani, John M. Carulli, Kenneth M. Butler, Vijay Reddy |
| 2013 | ITC | Test data analytics - Exploring spatial and test-item correlations in production test data. | Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler |
| 2013 | ITC | Counterfeit electronics: A rising threat in the semiconductor manufacturing industry. | Ke Huang, John M. Carulli, Yiorgos Makris |
| 2004 | ITC | Impact of Negative Bias Temperature Instability on Product Parametric Drift. | Vijay Reddy, John M. Carulli, Anand T. Krishnan, William Bosch, Brendan Burgess |