Fast and accurate linearity test for DACs with various architectures using segmented models.
Shravan K. Chaganti, Abalhassan Sheikh, Sumit Dubey, Frank Ankapong, Nitin Agarwal, Degang Chen
Browse the full ITC paper archive.
Shravan K. Chaganti, Abalhassan Sheikh, Sumit Dubey, Frank Ankapong, Nitin Agarwal, Degang Chen
Browse the full ITC paper archive.