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Degang Chen

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

161

Venues

11

Active years

1996–2026

Best venue rank

A*

Where they publish

Papers

161 indexed papers, newest first.

YearVenueTitleAuthors
2026VTSVTS2026 Contest Publication: TTTC's E.J. McCluskey Best Doctoral Thesis Award.Luca Benini, Paolo Bernardi, Alberto Bosio, Swarup Bhunia, Riccardo Cantoro, Degang Chen, Krishnendu Chakrabarty, Jayeeta Chaudhuri, Bastien Deveautour, Gabriele Filipponi, Angelo Garofalo, Salvatore Pappalardo, Sudipta Paria, Michael Rogenmoser, Philippe Sauter, Michael Sekyere, Chen Wu
2026VTSHigh-Purity, Low-Cost DAC-Based Multitone Waveform Generation for Built-In-Self-Test Applications.Emmanuel Nti Darko, Saeid Karimpour, Degang Chen
2026VTSA Physics-Informed Machine Learning Framework for Electromigration Time-to-Failure Prediction.Saeid Karimpour, Emmanuel Nti Darko, Kelvin W. Tamakloe, Degang Chen
2026VTSInnovative Practices Session: Applying Analog Scan to Industrial Circuits.Stephen Sunter, Marampally Saikiran, Degang Chen, Ashok Mathur
2025CECMGO: A Multi-Granularity Optimization Algorithm Based on Granular-balls.Bin Hou, Degang Chen, Guoyin Wang, Shuyin Xia
2025CECA Multi-Granularity Fireworks Algorithm with Collaboration and Competition for Solving the Influence Maximization Problem.Bin Hou, Guoyin Wang, Shuyin Xia, Degang Chen
2025ISCASA Compact 3-Segment 15-bit Capacitive DAC with Digital Calibration for Improved Linearity.Emmanuel Nti Darko, Isaac Bruce, Ekaniyere Oko-Odion, Saeid Karimpour, Kushagra Bhatheja, Degang Chen
2025ISCASSignal Flow Graph Analysis of Analog Circuits using Principles of Control Theory : Tutorial Review.Michael Sekyere, Marampally Saikiran, Degang Chen
2025ISCASRobust Defect Detection for Phase-Locked Loops using All-Digital Built-In Self-Test (BIST) Circuitry.Michael Sekyere, Marampally Saikiran, Rob Butler, Reed Adams, Degang Chen
2025ITCUltra-Pure High-Resolution Waveform Generation Using Low-Cost Data Converters with Dithering.Emmanuel Nti Darko, Saeid Karimpour, Ekaniyere Oko-Odion, Godfred Bonsu, Degang Chen
2025ITCAn On-Chip Sensor For Online Monitoring of HCI-Induced Aging In Integrated Analog Circuits.Saeid Karimpour, Emmanuel Nti Darko, Degang Chen
2025VTSHigh-Accuracy, Cost-Effective Built-In Self-Test Approach for High-Resolution Data Converters.Emmanuel Nti Darko, Saeid Karimpour, Degang Chen
2024ITCA Robust On-Chip Sensor for Online Monitoring of BTI-Induced Aging in Integrated Circuits.Daniel Adjei, Emmanuel Nti Darko, Degang Chen
2023ISCASA Resistorless Precision Curvature-Compensated Bandgap Voltage Reference Based on the VGO Extraction Technique.Daniel Adjei, Bryce Gadogbe, Degang Chen, Randall L. Geiger
2023ISCASSub-ppm/°C High Performance Voltage Reference.Bryce Gadogbe, Daniel Adjei, Kwabena Oppong Banahene, Randall L. Geiger, Degang Chen
2022ETSGraph Theory Approach for Multi-site ATE Board Parameter Extraction.Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022IOLTSAll Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage.Michael Sekyere, Marampally Saikiran, Degang Chen
2022ISCASHardware Security Vulnerability in Analog Signal Chain Filters.Kwabena Oppong Banahene, Matthew R. Strong, Bryce Gadogbe, Degang Chen, Randall L. Geiger
2022ISCASLevel Shifters for Charge Constrained Applications.Kushagra Bhatheja, Matthew R. Strong, Degang Chen
2022ISCASA Wide-Range Low-cost Temperature to Digital Converter Independent of Device Models.Mona Ganji, Marampally Saikiran, Degang Chen
2022ISCASRobust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection.Marampally Saikiran, Mona Ganji, Degang Chen
2022ITCLow Cost High Accuracy Stimulus Generator for On-chip Spectral Testing.Kushagra Bhatheja, Shravan K. Chaganti, Degang Chen, Xiankun Robert Jin, Chris C. Dao, Juxiang Ren, Abhishek Kumar, Daniel Correa, Mark Lehmann, Thomas Rodriguez, Eric Kingham, Joel R. Knight, Allan Dobbin, Scott W. Herrin, Doug Garrity
2022ITCOptimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing.Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022VTSThe Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing.Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022VTSAll Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis.Mona Ganji, Marampally Saikiran, Degang Chen
2021ETSAn Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study.Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021ICMLCFuzzt Set-Based Kernel Extreme Learning Machine Autoencoder for Multi-Label Classification.Qingshuo Zhang, Eric C. C. Tsang, Meng Hu, Qiang He, Degang Chen
2021ITCSystematic Hardware Error Identification and Calibration for Massive Multisite Testing.Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2020ICMLCA Fast Reduction Algorithm with Attribute Pre-Sort Based on Neighborhood Rough Set.Meng Hu, Eric C. C. Tsang, Yanting Guo, Weihua Xu, Degang Chen
2020ISCASA Simple Bandgap Reference Based on VGO Extraction with Single-Temperature Trimming.Pangzhou Li, Nanqi Liu, Degang Chen
2020ISCASA Low-Power and Area-Efficient Analog Duty Cycle Corrector for ADC's External Clocks.Nanqi Liu, Jim Todsen, Degang Chen
2020ITCRobust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage.Marampally Saikiran, Mona Ganji, Degang Chen
2020VTSQuantile - Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing.Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2019ISCASBandgap Voltage VGO Extraction with Two-Temperature Trimming for Designing Sub-ppm/°C Voltage References.Nanqi Liu, Randy Geiger, Degang Chen
2019ITCBuilt-in self-test and self-calibration for analog and mixed signal circuits.Tao Chen, Degang Chen
2019VTSAn Accurate and Efficient Method for Eliminating the Requirement of Coherent Sampling in Multi-Tone Test.Cheng Ban, Minshun Wu, Jiangtao Xu, Li Geng, Degang Chen
2018ICMLCLogical Disjunction Double-Quantitative Fuzzy Rough Sets.Yanting Guo, Eric C. C. Tsang, Weihua Xu, Degang Chen
2018ISCASA low-cost jitter separation and ADC spectral testing method without requiring coherent sampling.Shravan K. Chaganti, Li Xu, Degang Chen
2018ISCASConcurrent Sampling with Local Digitization - An Alternative to Analog Test Bus.Nanqi Liu, Shravan K. Chaganti, Zhiqiang Liu, Degang Chen, Amitava Majumdar
2018ISCASA Transient-Enhanced Fully-Integrated LDO Regulator for SoC Application.Nanqi Liu, Brian Johnson, Vinay Nadig, Degang Chen
2018ISCASA High Constancy Rail-to-rail Level Shift Generator for SEIR-based BIST circuit for ADCs.Hao Meng, Randall L. Geiger, Degang Chen
2018ISCASTransparent side channel trigger mechanism on analog circuits with PAAST hardware Trojans.Qianqian Wang, Degang Chen, Randall L. Geiger
2018ITCFast and accurate linearity test for DACs with various architectures using segmented models.Shravan K. Chaganti, Abalhassan Sheikh, Sumit Dubey, Frank Ankapong, Nitin Agarwal, Degang Chen
2017ISCASA voltage reference generator targeted at extracting the silicon bandgap Vgo from Vbe.Zhiqiang Liu, Degang Chen
2017ISCASA digital clock-less pulse stretcher with application in deep sub-nanosecond pulse detection.Zhiqiang Liu, Nanqi Liu, Shravan K. Chaganti, Degang Chen, Amitava Majumdar
2017ISCASAccurate spectral testing of the signals with amplitude drift.Yuming Zhuang, Degang Chen
2017ITCAn on-chip ADC BIST solution and the BIST enabled calibration scheme.Xiankun Jin, Tao Chen, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen
2017ITCAccurate ADC testing with significantly relaxed instrumentation including large cumulative jitter.Li Xu, Yuming Zhuang, Rajavelu Thinakaran, Kenneth M. Butler, Degang Chen
2017ITCAccurate and robust spectral testing with relaxed instrumentation requirements.Yuming Zhuang, Degang Chen
2017VTSA low-cost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter.Shravan K. Chaganti, Li Xu, Degang Chen
2017VTSAccurate jitter decomposition in high-speed links.Yan Duan, Degang Chen
2016ICMLCMinimum decision cost reduct for fuzzy decision-theoretic rough set model.Jingjing Song, Eric C. C. Tsang, Degang Chen, Xibei Yang
2016ISCASLow-cost dithering generator for accurate ADC linearity test.Yan Duan, Tao Chen, Degang Chen
2016ISCASToward complete analog fault coverage with minimal observation points using a fault propagation graph.Zhiqiang Liu, Shravan K. Chaganti, Degang Chen
2016ISCASNew strategies in removing non-coherency from signals with large distortion to noise ratios.Yuming Zhuang, Degang Chen
2016ITCLow cost ultra-pure sine wave generation with self calibration.Yuming Zhuang, Akhilesh Kesavan Unnithan, Arun Joseph, Siva Sudani, Benjamin Magstadt, Degang Chen
2016VTSAccurate spectral testing with non-coherent sampling for large distortion to noise ratios.Yuming Zhuang, Degang Chen
2016VTSAccurate linearity testing with impure sinusoidal stimulus robust against flicker noise.Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen
2015ICMLCGranular structures of fuzzy rough sets based on general fuzzy relations.Xiao Zhang, Changlin Mei, Degang Chen
2015ISCASPerformance enhancement induced Trojan states in op-amps, their detection and removal.Chongli Cai, Degang Chen
2015ISCASHigh-constancy offset generator robust to CDAC nonlinearity for SEIR-based ADC BIST.Yan Duan, Tao Chen, Zhiqiang Liu, Xu Zhang, Degang Chen
2015ISCASA novel 20-bit R-2R DAC structure based on ordered element matching.You Li, Degang Chen
2015ISCASA programmable temperature trigger circuit.Qianqian Wang, Randall L. Geiger, Degang Chen
2015ISCASDirect temperature to digital converters with low supply sensitivity for power/thermal management.Yen-Ting Wang, Chen Zhao, Degang Chen, Randall L. Geiger
2015ISCASAccurate spectral testing of analog-to-digital converters with frequency drift using phase correction and averaging.Li Xu, Degang Chen
2015ISCASA low cost jitter estimation and ADC spectral testing method.Li Xu, Degang Chen
2015ISCASAn integrated circuit solution of thermal noise thermometer with cascaded pre-amplifier and 6-bit resolution analog-to-digital converter.Xu Zhang, Degang Chen
2015ISCASCascode and transconductance with capacitances feedback compensation for multistage amplifiers driving no load and 1nF capacitive load.Xu Zhang, Chongli Cai, Degang Chen, Gregory Blum
2015ISCASA calibration technique for SAR analog-to-digital converter based on INL testing with quantization bits and redundant bit.Xu Zhang, Chongli Cai, Hao Meng, Siva Sudani, Randall L. Geiger, Degang Chen
2015SMCNovel Multi-output Support Vector Regression Model via Double Regularization.Yanyan Yang, Degang Chen, Ze Dong
2015VTSUltrafast stimulus error removal algorithm for ADC linearity test.Tao Chen, Degang Chen
2015VTSA low cost jitter separation and characterization method.Li Xu, Yan Duan, Degang Chen
2014ISCASEfficient analog verification against Trojan states using divide and contraction method.You Li, Degang Chen
2014ISCASIdentification and break of positive feedback loops in Trojan States Vulnerable Circuits.Zhiqiang Liu, You Li, Yan Duan, Randall L. Geiger, Degang Chen
2014ITCFast co-test of linearity and spectral performance with non-coherent sampled and amplitude clipped data.Li Xu, Degang Chen
2014VTSAuto-identification of positive feedback loops in multi-state vulnerable circuits.Zhiqiang Liu, You Li, Randall L. Geiger, Degang Chen
2014VTSAccurate and efficient method of jitter and noise separation and its application to ADC testing.Li Xu, Degang Chen
2013ICMLCA new algorithm of attribute reduction based on fuzzy clustering.Min Zhang, Degang Chen, Yanyan Yang
2013ISCASA high resolution and high accuracy R-2R DAC based on ordered element matching.You Li, Tao Zeng, Degang Chen
2013ISCASReliability degradation with electrical, thermal and thermal gradient stress in interconnects.Srijita Patra, Degang Chen, Randy Geiger
2013ISCASHigh resolution ADC spectral test with known impure source and non-coherent sampling.Siva Sudani, Degang Chen, Randall L. Geiger
2013ISCASPractical methods for verifying removal of Trojan stable operating points.Yen-Ting Wang, Degang Chen, Randall L. Geiger
2013ISCASA CMOS on-chip temperature sensor with -0.21°C 0.17 °C inaccuracy from -20 °C to 100 °C.Chen Zhao, Yen-Ting Wang, David Genzer, Degang Chen, Randall L. Geiger
2013ITCTest time reduction with SATOM: Simultaneous AC-DC Test with Orthogonal Multi-excitations.Degang Chen, Zhongjun Yu, Krunal Maniar, Mojtaba Nowrozi
2013ITCAccurate full spectrum test robust to simultaneous non-coherent sampling and amplitude clipping.Siva Sudani, Li Xu, Degang Chen
2012GRCImproved Algorithm and Further Research of β -reduct for variable precision rough set.Yanyan Yang, Degang Chen
2012ICMLCA new method of attribute reduction for covering rough sets.Wan-Lv Li, Degang Chen, Yanyan Yang
2012ICMLCAn attribute reduction method based on core samples set.Eric C. C. Tsang, Chen-Xia Jin, Degang Chen, Fa-Chao Li
2012ICMLCFRS-based decision table reduction for the operation optimization of large coal-fired power units.Ning-Ling Wang, Degang Chen, Yongping Yang, Ting Zhang
2012ICMLCFuzzy rough sets based uncertainty measuring for stream based active learning.Ran Wang, Sam Kwong, Degang Chen, Qiang He
2012ICMLCSVR-GA-Based adaptive power coal rate modeling and optimization for large coal-fired power units.Ning-Ling Wang, Ting Zhang, Yongping Yang, Degang Chen
2012ISCASA low cost method for testing offset and gain error for ADC BIST.Jingbo Duan, Degang Chen, Randall L. Geiger
2012ISCASSinusoidal signal generation for production testing and BIST applications.Bharath K. Vasan, Siva Sudani, Degang Chen, Randall L. Geiger
2012ISCASA compact low-power supply-insensitive CMOS current reference.Chen Zhao, Randall L. Geiger, Degang Chen
2012ITCAlgorithm for dramatically improved efficiency in ADC linearity test.Zhongjun Yu, Degang Chen
2011ICMLCA new method for multi-class support vector machines by training least number of classifiers.Ran Wang, Sam Kwong, Degang Chen
2011ICMLCNovel algorithms of attribute reduction for variable precision rough set.Yanyan Yang, Degang Chen, Sam Kwong
2011ISCASSNR measurement based on linearity test for ADC BIST.Jingbo Duan, Degang Chen
2011ISCASLinear vt-based temperature sensors with low process sensitivity and improved power supply headroom.Chen Zhao, Jun He, Sheng-Huang Lee, Karl Peterson, Randall L. Geiger, Degang Chen
2011ITCA novel robust and accurate spectral testing method for non-coherent sampling.Siva Sudani, Minshun Wu, Degang Chen
2010ICMLCSample selection with rough set.Degang Chen, Xiao Zhang, Eric C. C. Tsang, Yongping Yang
2010ICMLCOn the fuzzy generalization of the Dempster-Shafer theory of evidence.Eric C. C. Tsang, Degang Chen
2010ICMLCData mining-based modeling and application in the energy-saving analysis of large coal-fired power units.Yongping Yang, Ning-Ling Wang, Zhi-Wei Zhang, Degang Chen
2010ISCASPhase control of triangular stimulus generator for ADC BIST.Jingbo Duan, Degang Chen, Randall L. Geiger
2010ISCASINL based dynamic performance estimation for ADC BIST.Jingbo Duan, Le Jin, Degang Chen
2010ISCASDetailed analyses in prediction of capacitive-mismatch-induced offset in dynamic comparators.Jun He, Degang Chen, Randall L. Geiger
2010ISCASLinearity testing of ADCs using low linearity stimulus and Kalman filtering.Bharath K. Vasan, Randall L. Geiger, Degang Chen
2010ISCASNew calibration technique for current-steering DACs.Tao Zeng, Degang Chen
2010ISCASOutput impedance linearization technique for current-steering DACs.Tao Zeng, Degang Chen
2010ITCA new method for estimating spectral performance of ADC from INL.Jingbo Duan, Le Jin, Degang Chen
2010SMCLeast squares support vector machines based on fuzzy rough set.Zhi-Wei Zhang, Degang Chen, Qiang He, Hui Wang
2009ISCASCost Effective Signal Generators for ADC BIST.Jingbo Duan, Degang Chen, Randall L. Geiger
2009ISCASOptimal Area and Impedance Allocation for Dual-string DACs.Thu T. Duong, Degang Chen, Randall L. Geiger
2008ISCASA simple and accurate method to predict offset voltage in dynamic comparators.Jun He, Sanyi Zhan, Degang Chen, Randall L. Geiger
2008ISCASAdjustable hysteresis CMOS Schmitt triggers.Vipul Katyal, Randall L. Geiger, Degang Chen
2008ISCASSystem identification -based reduced-code testing for pipeline ADCs' linearity test.Hanqing Xing, Degang Chen, Randall L. Geiger, Le Jin
2007ISCASDeterministic DEM DAC Performance Analysis.Hanjun Jiang, Degang Chen, Randall L. Geiger
2007ITCA fully digital-compatible BIST strategy for ADC linearity testing.Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger
2007SMCAn approach of attributes reduction based on fuzzy TL rough sets.Degang Chen, Eric C. C. Tsang, Suyun Zhao
2007VTSCode-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal.Le Jin, Degang Chen, Randall L. Geiger
2006ISCASExplicit characterization of bandgap references.Xin Dai, Degang Chen, Randall L. Geiger
2006ISCASA self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient.Le Jin, Hanqing Xing, Degang Chen, Randall L. Geiger
2006ISCASLinearity test for high resolution DACs using low-accuracy DDEM flash ADCs.Hanqing Xing, Degang Chen, Randall L. Geiger
2006ISCASCharacterization of a current-mode bandgap circuit structure for high-precision reference applications.Hanqing Xing, Le Jin, Degang Chen, Randall L. Geiger
2006ITCLinearity Test of Analog-to-Digital Converters Using Kalman Filtering.Le Jin, Degang Chen, Randall L. Geiger
2006ITCTesting of Precision DACs Using Low-Resolution ADCs with Dithering.Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen
2006SMCA Discussion of Attribute Reduction in Fuzzy Rough Sets Using Support Vector Machine.Eric C. C. Tsang, Degang Chen, Suyun Zhao, Qiang He
2005ADMAThe Infinite Polynomial Kernel for Support Vector Machine.Degang Chen, Qiang He, Xizhao Wang
2005ICMLCA Method to Construct the Mapping to the Feature Space for the Dot Product Kernels.Degang Chen, Qiang He, Chunru Dong, Xizhao Wang
2005ICMLCOn the Local Reduction of Information System.Degang Chen, Eric C. C. Tsang
2005ISCASAn adaptive, truly background calibration method for high speed pipeline ADC design.Degang Chen, Zhongjun Yu, Randall L. Geiger
2005ISCASA cost-effective histogram test-based algorithm for digital calibration of high-precision pipelined ADCs.Xin Dai, Degang Chen, Randall L. Geiger
2005ISCASAn NXin Dai, Chengming He, Hanqing Xing, Degang Chen, Randall L. Geiger
2005ISCASDither incorporated deterministic dynamic element matching for high resolution ADC test using extremely low resolution DACs.Hanjun Jiang, Degang Chen, Randall L. Geiger
2005ISCASA digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals.Le Jin, Degang Chen, Randall L. Geiger
2005ISCASA test strategy for time-to-digital converters using dynamic element matching and dithering.Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger, Degang Chen
2005ISCASA segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test.Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger
2005ISCASA two-step DDEM ADC for accurate and cost-effective DAC testing.Hanqing Xing, Degang Chen, Randall L. Geiger
2005ISCASPipeline ADC linearity testing with dramatically reduced data capture time.Zhongjun Yu, Degang Chen, Randall L. Geiger, Ioannis Papantonopoulos
2005ITCHigh-performance ADC linearity test using low-precision signals in non-stationary environments.Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Randall L. Geiger, Degang Chen
2005ITCA 16-bit resistor string DAC with full-calibration at final test.Kumar L. Parthasarathy, Turker Kuyel, Zhongjun Yu, Degang Chen, Randall L. Geiger
2005SMCOn attributes reduction with fuzzy rough sets.Gloria C. Y. Tsang, Degang Chen, Eric C. C. Tsang, John W. T. Lee, Daniel S. Yeung
2004ISCASOptimum area allocation for resistors and capacitors in continuous-time monolithic filters.Haibo Fei, Randall L. Geiger, Degang Chen
2004ISCASRobust design of high gain amplifiers using dynamical systems and bifurcation theory.Chengming He, Le Jin, Degang Chen, Randall L. Geiger
2004ISCASNChengming He, Kuangming Yap, Degang Chen, Randall L. Geiger
2004ISCASA background digital self-calibration scheme for pipelined ADCs based on transfer curve estimation.Hanjun Jiang, Haibo Fei, Degang Chen, Randall L. Geiger
2004ISCASAn SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli.Le Jin, Chengming He, Degang Chen, Randall L. Geiger
2004ISCASFast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals.Le Jin, Chengming He, Degang Chen, Randall L. Geiger
2004ISCASTesting high resolution ADCs using deterministic dynamic element matching.Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger
2004ISCASParameter optimization of deterministic dynamic element matching DACs for accurate and cost-effective ADC testing.Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger
2004ISCASA novel 1.5 V CMFB CMOS down-conversion mixer design for IEEE 802.11 A WLAN systems.Xuezhen Wang, Robert Weber, Degang Chen
2004ISCASThe SRE/SRM approach for spectral testing of AMS circuits.Zhongjun Yu, Degang Chen, Randall L. Geiger
2004ISCASAccurate testing of ADC's spectral performance using imprecise sinusoidal excitations.Zhongjun Yu, Degang Chen, Randall L. Geiger
2004ITCTesting High Resolution ADCs with Low Resolution/Accuracy Deterministic Dynamic Element Matched DACs.Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger
2004ITCA Computationally Efficient Method for Accurate Spectral Testing without Requiring Coherent Sampling.Zhongjun Yu, Degang Chen, Randall L. Geiger
2003ISCASA low-voltage compatible two-stage amplifier with ≥120 dB gain in standard digital CMOS.Chengming He, Degang Chen, Randall L. Geiger
2003ISCASA deterministic dynamic element matching approach to ADC testing.Beatriz Olleta, Lance Juffer, Degang Chen, Randall L. Geiger
2003ISCASExperimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance.Kumar L. Parthasarathy, Le Jin, Turker Kuyel, Dana Price, Degang Chen, Randall L. Geiger
2003ISCAS1-D and 2-D switching strategies achieving near optimal INL for thermometer-coded current steering DACs.Zhongjun Yu, Degang Chen, Randall L. Geiger
2003ITCLinearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs.Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger
1996ICRAOptimal motion planning for flexible space robots.Hongchao Zhao, Degang Chen