A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing.
Mohamed M. Hafed, Antonio H. Chan, Geoffrey D. Duerden, Bardia Pishdad, Clarence Tam, Sbastien Laberge, Gordon W. Roberts
Browse the full ITC paper archive.
Mohamed M. Hafed, Antonio H. Chan, Geoffrey D. Duerden, Bardia Pishdad, Clarence Tam, Sbastien Laberge, Gordon W. Roberts
Browse the full ITC paper archive.