Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
ITC
/
Paper
Test Generation with High Coverages for Quiescent Current Test of Bridging Faults in Combinational Circuits.
Eugeni Isern
,
Joan Figueras
Venue
A
ITC
Year
1993
Proceedings
ITC
DBLP record
conf/itc/IsernF93 ↗
Browse the full
ITC paper archive
.