Reliable and self-repairing SRAM in nano-scale technologies using leakage and delay monitoring.
Saibal Mukhopadhyay, Kunhyuk Kang, Hamid Mahmoodi, Kaushik Roy
Browse the full ITC paper archive.
Saibal Mukhopadhyay, Kunhyuk Kang, Hamid Mahmoodi, Kaushik Roy
Browse the full ITC paper archive.