| 2025 | DAC | Late Breaking Results: Utilization of Hybrid Threshold-Voltage Flip-flops for Power Recovery. | Sehyeon Chung, Hyun-chul Hwang, Byung-Su Kim, Jaeha Lee, Kunhyuk Kang, Taewhan Kim |
| 2008 | ASPDAC | NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution? | Kunhyuk Kang, Saakshi Gangwal, Sang Phill Park, Kaushik Roy |
| 2007 | DAC | Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement. | Kunhyuk Kang, Keejong Kim, Ahmad E. Islam, Muhammad Ashraful Alam, Kaushik Roy |
| 2007 | DAC | Variation Resilient Low-Power Circuit Design Methodology using On-Chip Phase Locked Loop. | Kunhyuk Kang, Keejong Kim, Kaushik Roy |
| 2007 | DAC | High Performance and Low Power Electronics on Flexible Substrate. | Jing Li, Kunhyuk Kang, Aditya Bansal, Kaushik Roy |
| 2007 | ICCAD | Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance. | Kunhyuk Kang, Sang Phill Park, Kaushik Roy, Muhammad Ashraful Alam |
| 2007 | ITC | Characterization of NBTI induced temporal performance degradation in nano-scale SRAM array using IDDQ. | Kunhyuk Kang, Muhammad Ashraful Alam, Kaushik Roy |
| 2006 | DATE | Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits. | Bipul Chandra Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy |
| 2006 | ICCD | Efficient Transistor-Level Sizing Technique under Temporal Performance Degradation due to NBTI. | Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy |
| 2005 | DATE | Statistical Timing Analysis using Levelized Covariance Propagation. | Kunhyuk Kang, Bipul Chandra Paul, Kaushik Roy |
| 2005 | ICCAD | Accurate estimation and modeling of total chip leakage considering inter- & intra-die process variations. | Amit Agarwal, Kunhyuk Kang, Kaushik Roy |
| 2005 | ISLPED | Effectiveness of low power dual-V | Amit Agarwal, Kunhyuk Kang, Swarup Bhunia, James D. Gallagher, Kaushik Roy |
| 2005 | ITC | Reliable and self-repairing SRAM in nano-scale technologies using leakage and delay monitoring. | Saibal Mukhopadhyay, Kunhyuk Kang, Hamid Mahmoodi, Kaushik Roy |