Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
ITC
/
Paper
On-Die DFT Based Solutions are Sufficient for Testing Multi-GHz Interfaces in Manufacturing (and Are Also Key to Enabling Lower Cost ATE Platforms).
Mike Tripp
Venue
A
ITC
Year
2002
Proceedings
ITC
DBLP record
conf/itc/Tripp02 ↗
Browse the full
ITC paper archive
.