Mike Tripp
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
7
Venues
2
Active years
2001–2005
Best venue rank
A
Where they publish
Papers
7 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2005 | ITC | Drive only at speed functional testing; one of the techniques Intel is using to control test costs. | Mike Tripp, Silvio Picano, Baruch Schnarch |
| 2004 | ITC | ITC 2004 Panel: Cost of Test - Taking Control. | Mike Tripp |
| 2004 | ITC | Elimination of Traditional Functional Testing of Interface Timings at Intel. | Mike Tripp, T. M. Mak, Anne Meixner |
| 2003 | ITC | Elimination of Traditional Functional Testing of Interface Timings at Intel. | Mike Tripp, T. M. Mak, Anne Meixner |
| 2002 | ITC | Realizing the Benefits of Structural Test for Intel Microprocessors. | Mike Mayberry, John Johnson, Navid Shahriari, Mike Tripp |
| 2002 | ITC | On-Die DFT Based Solutions are Sufficient for Testing Multi-GHz Interfaces in Manufacturing (and Are Also Key to Enabling Lower Cost ATE Platforms). | Mike Tripp |
| 2001 | VTS | Reliability Beyond GHz. | Pete O'Neill, Ron Richmond, Mike Tripp, Barbara Vasquez, Art Wager, Zeev Weinberg |