Reformatting Test Patterns for Testing Embedded Core Based System Using Test Access Mechanism (TAM) Switch.
Subhayu Basu, Debdeep Mukhopadhyay, Dipanwita Roy Chowdhury, Indranil Sengupta, Sudipta Bhawmik
Browse the full VLSID paper archive.
Subhayu Basu, Debdeep Mukhopadhyay, Dipanwita Roy Chowdhury, Indranil Sengupta, Sudipta Bhawmik
Browse the full VLSID paper archive.