A Universal Random Test Generator for Functional Verification of Microprocessors and System-on-Chip.
K. Uday Bhaskar, M. Prasanth, G. Chandramouli, V. Kamakoti
Browse the full VLSID paper archive.
K. Uday Bhaskar, M. Prasanth, G. Chandramouli, V. Kamakoti
Browse the full VLSID paper archive.