Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
VLSID
/
Paper
Testing Embedded Cores and SOCs-DFT, ATPG and BIST Solutions.
Rubin A. Parekhji
Venue
National
VLSID
Year
2003
Proceedings
VLSI Design
DBLP record
conf/vlsid/Parekhji03 ↗
Browse the full
VLSID paper archive
.