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Paper
Path Delay Fault Test Generation for Standard Scan Designs Using State Tuples.
Yun Shao
,
Irith Pomeranz
,
Sudhakar M. Reddy
Venue
National
VLSID
Year
2002
Proceedings
ASP-DAC/VLSI Design
DBLP record
conf/vlsid/ShaoPR02 ↗
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